Zobrazeno 1 - 10
of 89
pro vyhledávání: '"Dal'zotto, B."'
Publikováno v:
In Microelectronic Engineering 2003 67:149-156
Publikováno v:
In Microelectronic Engineering 2002 61:755-761
Autor:
Caillat, C. *, Deleonibus, S., Guegan, G., Heitzmann, M., Nier, M.E., Tedesco, S., Dal'zotto, B., Martin, F., Mur, P., Papon, A.M., Lecarval, G., Previtali, B., Toffoli, A., Allain, F., Biswas, S., Jourdan, F., Fugier, P., Dichiaro, J.L.
Publikováno v:
In Solid State Electronics 2002 46(3):349-352
A 0.10 μm buried p-channel MOSFET with through the gate boron implantation and arsenic tilted pocket
Autor:
Guegan, G. *, Deleonibus, S., Caillat, C., Tedesco, S., Dal’zotto, B., Heitzmann, M., Nier, M.E., Mur, P.
Publikováno v:
In Solid State Electronics 2002 46(3):343-348
Publikováno v:
In Journal of Magnetism and Magnetic Materials 2001 226 Part 2:1708-1710
Autor:
Mollard, L ∗, Tedesco, S, Dal’zotto, B, Jaubert, V, Pain, L, Fanget, G, Comboroure, C, Morand, Y, Fayolle, M
Publikováno v:
In Microelectronic Engineering 2001 57:269-275
Autor:
Zelsmann, M., Charvolin, T., Heitzmann, M., Dal’zotto, B., Nier, M., Seassal, C., Rojo-Romeo, P., Letartre, X., Zanatta, J., Noël, F., Ballet, P., Hdadach, N., Million, A., Destefanis, G., Mottin, E., Kopp, C., Picard, E., Hadji, Emmanuel
Publikováno v:
Journal of Electronic Materials
Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2003, 32 (7), pp.602-607
Journal of Electronic Materials, 2003, 32 (7), pp.602-607
Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2003, 32 (7), pp.602-607
Journal of Electronic Materials, 2003, 32 (7), pp.602-607
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3a8136aac585600c0899c0a4c5721ab9
https://hal-cea.archives-ouvertes.fr/cea-01996933
https://hal-cea.archives-ouvertes.fr/cea-01996933
Autor:
Zelsmann, M., Picard, E., Charvolin, T., Dal’zotto, B., Nier, M., Seassal, C., Rojo-Romeo, P., Letartre, X., Sotta, D., Hadji, Emmanuel, Magnea, N., Delamadeleine, E., Besson, P., Renard, P., Moriceau, H.
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, 2002, 92 (4), pp.2207-2209
Journal of Applied Physics, American Institute of Physics, 2002, 92 (4), pp.2207-2209
Journal of Applied Physics, 2002, 92 (4), pp.2207-2209
Journal of Applied Physics, American Institute of Physics, 2002, 92 (4), pp.2207-2209
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::6f19ea9363860d4c9e8e9960eadb01f9
https://hal-cea.archives-ouvertes.fr/cea-01996938
https://hal-cea.archives-ouvertes.fr/cea-01996938
Autor:
Szmanda, C.S., Brainard, R.L., Mackevich, J.F., Awaji, A., Tanaka, T., Yamada, Y., Bohland, J., Tedesco, S., Dal'Zotto, B., Brünger, W.H., Torkler, M., Fallmann, W., Löschner, H., Käsmaier, R., Nealey, P.M., Pawloski, A.R.
A method for measuring acid generation efficiency is presented and utilized to determine the relative efficiency of four photoacid generators (PAGs) upon radiation with photon, electron, and ion beams. In this method, chemically amplified resists are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::4a3cce690e34a78fd29ad0d1ad0aa756
https://publica.fraunhofer.de/handle/publica/195365
https://publica.fraunhofer.de/handle/publica/195365
Autor:
Engelmann, Sebastian U., Wise, Rich S., Landis, S., Teyssedre, H., Claveau, G., Servin, I., Delachat, F., Pourteau, M. L., Gharbi, A., Pimenta Barros, P., Tiron, R., Nouri, L., Possemé, N., May, M., Brianceau, P., Barnola, S., Blancquaert, Y., Pradelles, J., Essomba, P., Bernadac, A., Dal'zotto, B., Bos, S., Argoud, M., Chamiot-Maitral, G., Sarrazin, A., Tallaron, C., Lapeyre, C., Pain, L.
Publikováno v:
Proceedings of SPIE; April 2017, Vol. 10149 Issue: 1 p101490K-101490K-13, 10047524p