Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Daisuke Iimori"'
Autor:
Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
Publikováno v:
2022 IEEE 31st Asian Test Symposium (ATS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3e90ca069c0d8fc6c995c9789e63d02
https://doi.org/10.1109/ats56056.2022.00019
https://doi.org/10.1109/ats56056.2022.00019
Autor:
Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Daisuke Iimori, Yuki Ozawa, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Publikováno v:
2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::195d45211c1c4487fd8525f675829059
https://doi.org/10.1109/icce-asia57006.2022.9954832
https://doi.org/10.1109/icce-asia57006.2022.9954832
Autor:
Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel Barragan, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Publikováno v:
2022 IEEE 40th VLSI Test Symposium (VTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12572171d842d9df95d3c606586d6a87
https://doi.org/10.1109/vts52500.2021.9794191
https://doi.org/10.1109/vts52500.2021.9794191
Autor:
Gaku Ogihara, Takayuki Nakatani, Daisuke Iimori, Shogo Katayama, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Jianglin Wei, Kazumi Hatayama, Haruo Kobayashi
Publikováno v:
2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ddf3c613bd3a92ebaec299f72145250
https://doi.org/10.1109/icecs53924.2021.9665508
https://doi.org/10.1109/icecs53924.2021.9665508
Autor:
Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
Publikováno v:
2021 IEEE 30th Asian Test Symposium (ATS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c1dfe01612ce8993ba9f8646bed719a9
https://doi.org/10.1109/ats52891.2021.00036
https://doi.org/10.1109/ats52891.2021.00036
Autor:
Shogo Katayama, Takayuki Nakatani, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi
Publikováno v:
IEICE Electronics Express. 20:20220470-20220470
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0cf896a2aea242cd667dc14a3da56ca5
https://doi.org/10.1587/elex.19.20220470
https://doi.org/10.1587/elex.19.20220470
Autor:
Toshiyuki Okamoto, Daisuke Iimori, Takashi Ishida, Akemi Hatta, Jianglin Wei, Shogo Katayama, Haruo Kobayashi, Keno Sato, Kazumi Hatayama, Anna Kuwana, Gaku Ogihara, Takayuki Nakatani, Tamotsu Ichikawa, Minh Tri Tran, Yujie Zhao
Publikováno v:
ITC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bce35375ad35679fa305bbc472cbbab7
https://doi.org/10.1109/itc50571.2021.00052
https://doi.org/10.1109/itc50571.2021.00052