Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Daiki Oki"'
Autor:
Cong Bing Li, Nobuo Takahashi, Seiichi Banba, Masataka Kamiyama, Haruo Kobayashi, Satoru Kawauchi, Daiki Oki, Toru Dan
Publikováno v:
Key Engineering Materials. 698:142-148
This paper describes multi-band low noise amplifiers (LNAs) utilizing input matching transformers. We investigate a conventional dual-band LNA circuit utilizing a transformer, and show our analysis and simulation results for its circuit. Based on thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ad89b5c2d91582a3409ed0303e67e4e
https://doi.org/10.4028/www.scientific.net/kem.698.142
https://doi.org/10.4028/www.scientific.net/kem.698.142
Autor:
Toru Dan, Nobuo Takahashi, Satoru Kawauchi, Seiichi Banba, Masataka Kamiyama, Cong Bing Li, Haruo Kobayashi, Daiki Oki
Publikováno v:
Key Engineering Materials. 643:109-116
This paper presents a power-efficient noise-canceling technique based on the feed-forward amplifiers, considering a fundamental tradeoff between noise figure (NF) and power consumption in the design of wide-band amplifiers. By suppressing the input s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d5e9a935761959f36be39732da3ec2ab
https://doi.org/10.4028/www.scientific.net/kem.643.109
https://doi.org/10.4028/www.scientific.net/kem.643.109
Autor:
Tatsuji Matsuura, Osamu Kobayashi, Yohei Tan, Haruo Kobayashi, Li Quan, Yukiko Arai, Zhi Xiang Yang, Nobukazu Takai, Zachary Nosker, Daiki Oki, Yu Liu, Kiichi Niitsu, Atsuhiro Katayama, En Si Li
Publikováno v:
Key Engineering Materials. 596:181-186
This paper proposes a digital self-calibration technique for pipelined ADC. In this technique, the pipelined ADC is composed of a series of cyclic ADCs and each stage has independent digital self-calibration. Because of this, our technique achieves h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd3246efba57fbdfdd8fd9be167ff380
https://doi.org/10.4028/www.scientific.net/kem.596.181
https://doi.org/10.4028/www.scientific.net/kem.596.181
Autor:
Daiki Oki, Naohiro Harigai, Daiki Hirabayashi, Masato Sakurai, Takahiro Yamaguchi, Haruo Kobayashi, Kiichi Niitsu
Publikováno v:
Key Engineering Materials. 534:197-205
This work presents the analytical study on jitter accumulation in interleaved phase frequency detectors for high-accuracy on-chip jitter measurements. Jitter accumulation in phase frequency detector degrades the accuracy of on-chip jitter measurement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b0f3c263aa89930786cb1591ed2f914
https://doi.org/10.4028/www.scientific.net/kem.534.197
https://doi.org/10.4028/www.scientific.net/kem.534.197
Autor:
Naohiro Harigai, Haruo Kobayashi, Masato Sakurai, Kiichi Niitsu, O. Kobayashi, Takao Yamaguchi, Daiki Hirabayashi, Daiki Oki
Publikováno v:
ASP-DAC
Design of a clock jitter reduction circuit that exploits the phase blending technique between the uncorrelated clock edges that are self-delayed by multiples of the clock cycle, nT is presented. By blending uncorrelated clock edges, the output clock
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27682d522c0c15dd6cde77f8dede81d9
https://doi.org/10.1109/aspdac.2013.6509577
https://doi.org/10.1109/aspdac.2013.6509577
Autor:
Masato Sakurai, Naohiro Harigai, Kiichi Niitsu, Takahiro Yamaguchi, Haruo Kobayashi, Daiki Oki, Daiki Hirabayashi
Publikováno v:
ISOCC
This work presents the analysis of jitter accumulation in interleaved phase frequency detectors for high-accuracy on-chip jitter measurements. Jitter accumulation in phase frequency detector degrades the accuracy of on-chip jitter measurements, and r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90ca1472cc2ff565600306c6e585ef61
https://doi.org/10.1109/isocc.2011.6138668
https://doi.org/10.1109/isocc.2011.6138668
Publikováno v:
Extended Abstracts of the 2011 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51464c4d9afd2d8a90855faaa58e5b12
https://doi.org/10.7567/ssdm.2011.p-5-13
https://doi.org/10.7567/ssdm.2011.p-5-13