Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Dai Tsukada"'
Autor:
Franco M. Staub, Emery Premeaux, Dai Tsukada, Shosuke Inoue, Christopher T. Raabe, Takeshi Tsuchiya
Publikováno v:
AIAA SCITECH 2022 Forum.
Publikováno v:
AIAA Scitech 2021 Forum.
Autor:
Emery Premeaux, Christopher T. Raabe, Takeshi Tsuchiya, Franco M. Staub, Shosuke Inoue, Dai Tsukada
Publikováno v:
AIAA Scitech 2021 Forum.
Publikováno v:
2018 AIAA Information Systems-AIAA Infotech @ Aerospace.
Publikováno v:
2018 AIAA Information Systems-AIAA Infotech @ Aerospace.
Autor:
Dai Tsukada, Christopher W. Lum
Publikováno v:
Encyclopedia of Aerospace Engineering
In order to achieve safe and successful operation of unmanned aerial systems (UAS), one must have a thorough understanding of the reliability of the system as well as the risks involved with its operation. This chapter describes a model and methodolo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7d9b576b5e5efd2c244538afa4c44cb0
https://doi.org/10.1002/9780470686652.eae1148
https://doi.org/10.1002/9780470686652.eae1148
Autor:
Yuta Matsumoto, Michitoshi Takeishi, Takanobu Saito, Dai Tsukada, Takashi Suemasu, Noritaka Usami, Ryo Sasaki
Publikováno v:
Journal of Crystal Growth. 311:3581-3586
We have prepared (1 1 1)-oriented Si layers on SiO 2 (fused silica) substrates from amorphous-Si(a-Si)/Al or Al/a-Si stacked layers using an aluminum-induced crystallization (AIC) method. The X-ray diffraction (XRD) intensity from the (1 1 1) planes
Publikováno v:
Journal of Crystal Growth. 310:1250-1255
We successfully demonstrated epitaxial growth of semiconductor (BaSi2)/metal(CoSi2) Schottky-barrier structures on Si(1 1 1), for the first time, by molecular beam epitaxy (MBE). The interface between the CoSi2 and BaSi2 layers was found to be sharp
Autor:
Dai Tsukada, Michitoshi Takeishi, Takanobu Saito, Yuta Matsumoto, Masato Sasase, Takashi Suemasu, Ryo Sasaki, Noritaka Usami
Publikováno v:
Japanese Journal of Applied Physics. 49:04DP05
We have grown BaSi2 epitaxial films and polycrystalline films by molecular-beam epitaxy on Si(111) and on (111)-oriented 100-nm-thick polycrystalline Si layers fabricated by an aluminum-induced crystallization method on SiO2, respectively. Electron b
Autor:
Michitoshi Takeishi, Takashi Suemasu, Dai Tsukada, Yuta Matsumoto, Teruhisa Ootsuka, Takanobu Saito, Ryo Sasaki
Publikováno v:
Japanese Journal of Applied Physics. 48:106507
Approximately 250-nm-thick undoped n-type BaSi2 epitaxial films were grown on n-Si(111) substrates by molecular beam epitaxy, and 1-mm-diameter mesa-isolated n-BaSi2/n-Si diode structures were successfully produced by wet chemical etching. Etching of