Výsledky vyhledávání - "Dai Joon Hyun"

Selective Use of Stitch-Induced Via for V0 Mask Reduction: Standard Cell Design and Placement Optimization

Autor: Youngsoo Shin, Younggwang Jung, Dai Joon Hyun

Publikováno v: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :1711-1719

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3f4fc0f46e8d094b5f8e3f103336abcd
https://doi.org/10.1587/transfun.e102.a.1711

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Modeling interconnect corners under double patterning misalignment

Autor: Dai Joon Hyun, Youngsoo Shin

Publikováno v: SPIE Proceedings.

Publisher’s Note : This paper, originally published on March 16th, was replaced with a corrected/revised version on March 28th. If you downloaded the original PDF but are unable to access the revision, please contact SPIE Digital Library Customer S

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::bfc498bcd41b9355bc0d280d78fcf6ba
https://doi.org/10.1117/12.2219150

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Timing Criticality for Timing Yield Optimization

Autor: Wook Kim, Young Hwan Kim, Hyoun Soo Park, Dai Joon Hyun

Publikováno v: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :3497-3505

Block-based SSTA analyzes the timing variation of a chip caused by process variations effectively. However, block-based SSTA cannot identify critical nodes, nodes that highly influence the timing yield of a chip, used as the effective guidance of tim

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b61cd7aff6e0ece5ae331ea1f253d097
https://doi.org/10.1093/ietfec/e91-a.12.3497

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Comparison of characterization methods for statistical analysis of SoC designs

Autor: Young Hwan Kim, Wook Kim, Kyung Tae Do, Dai Joon Hyun

Publikováno v: 2008 5th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology.

This paper compares characteristics and performances of characterization methods for statistical timing analysis and statistical leakage estimation. Two popular characterization methods, regular grid sampling and distribution based sampling are selec

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c2e82cf05b00710eb312006cb2d66139
https://doi.org/10.1109/ecticon.2008.4600549

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Conference

Comparison of characterization methods for statistical analysis of SoC designs.

Autor: Wook Kim, Dai Joon Hyun, Young Hwan Kim, Kyung Tae Do

Publikováno v: 2008 5th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications & Information Technology; 2008, p789-792, 4p

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