Mapping Morphological and Structural Properties of Lead Halide Perovskites by Scanning Nanofocus XRD

Autor: Lilliu, S, Dane, TG, Alsari, M, Griffin, J, Barrows, AT, Dahlem, MS, Friend, RH, Lidzey, DG, Macdonald, JE

Scanning nanofocus X-ray diffraction (nXRD) performed at a synchrotron is used to simultaneously probe the morphology and the structural properties of spin-coated CH$_3$NH$_3$PbI$_3$ (MAPI) perovskite films for photovoltaic devices. MAPI films are sp

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4fdcdb8b895c601a4b3093c7fa0e1301

A review of focused ion beam applications in optical fibers.

Autor: Sloyan K; Department of Mechanical and Materials Engineering, Khalifa University, SAN Campus, Abu Dhabi 127788, United Arab Emirates.; Laboratory for Energy and Nano Science (LENS), Khalifa University, SAN Campus, Abu Dhabi 127788, United Arab Emirates., Melkonyan H; Department of Physics, Yerevan State University, Yerevan 0025, Armenia., Apostoleris H; Department of Mechanical and Materials Engineering, Khalifa University, SAN Campus, Abu Dhabi 127788, United Arab Emirates.; Laboratory for Energy and Nano Science (LENS), Khalifa University, SAN Campus, Abu Dhabi 127788, United Arab Emirates., Dahlem MS; Interuniversity Microelectronics Center (IMEC), Leuven B-3001, Belgium., Chiesa M; Department of Mechanical and Materials Engineering, Khalifa University, SAN Campus, Abu Dhabi 127788, United Arab Emirates.; Laboratory for Energy and Nano Science (LENS), Khalifa University, SAN Campus, Abu Dhabi 127788, United Arab Emirates.; Department of Physics and Technology, UiT The Arctic University of Norway, Tromsø 9010, Norway., Al Ghaferi A; Department of Mechanical and Materials Engineering, Khalifa University, SAN Campus, Abu Dhabi 127788, United Arab Emirates.; Laboratory for Energy and Nano Science (LENS), Khalifa University, SAN Campus, Abu Dhabi 127788, United Arab Emirates.

Publikováno v: Nanotechnology [Nanotechnology] 2021 Sep 02; Vol. 32 (47). Date of Electronic Publication: 2021 Sep 02.

Compact silicon TE-pass polarizer using adiabatically-bent fully-etched waveguides.

Autor: Zafar H, Moreira P, Taha AM, Paredes B, Dahlem MS, Khilo A

Publikováno v: Optics express [Opt Express] 2018 Nov 26; Vol. 26 (24), pp. 31850-31860.

Integrating sphere based reflectance measurements for small-area semiconductor samples.

Autor: Saylan S; Masdar Institute, Khalifa University of Science and Technology, Abu Dhabi, United Arab Emirates., Howells CT; Masdar Institute, Khalifa University of Science and Technology, Abu Dhabi, United Arab Emirates., Dahlem MS; Masdar Institute, Khalifa University of Science and Technology, Abu Dhabi, United Arab Emirates.

Publikováno v: The Review of scientific instruments [Rev Sci Instrum] 2018 May; Vol. 89 (5), pp. 053101.

Gradient-index optofluidic waveguide in polydimethylsiloxane.

Autor: Odeh M, Voort B, Anjum A, Paredes B, Dimas C, Dahlem MS

Publikováno v: Applied optics [Appl Opt] 2017 Feb 01; Vol. 56 (4), pp. 1202-1206.