Zobrazeno 1 - 10
of 47
pro vyhledávání: '"Dae-Nyeon Kim"'
Autor:
Daeyoung Choi, Seung Hyun Paik, Young-Kyu Kim, Jong-Ho Yoo, SangWoo Jung, Tae-Hwan Kim, Dae-Nyeon Kim
Publikováno v:
The Journal of Korean Institute of Information Technology. 20:75-81
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1858bea0bb8baae846dbb73e060a3705
https://doi.org/10.14801/jkiit.2022.20.12.75
https://doi.org/10.14801/jkiit.2022.20.12.75
Publikováno v:
The Journal of Korean Institute of Information Technology. 20:41-50
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4649d2d33e396fc193a909fdf606f7af
https://doi.org/10.14801/jkiit.2022.20.6.41
https://doi.org/10.14801/jkiit.2022.20.6.41
Autor:
Young-Kyu Kim, SangWoo Jung, Jin Woo Kim, Gyu O Park, Tae Chang Kang, Je Eun Kim, Dae-Nyeon Kim
Publikováno v:
The Journal of Korean Institute of Information Technology. 20:57-65
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7868770650265e69bab43326da03a4db
https://doi.org/10.14801/jkiit.2022.20.3.57
https://doi.org/10.14801/jkiit.2022.20.3.57
Publikováno v:
The Journal of Korean Institute of Information Technology. 19:115-121
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ea012d8ee77dce2ffbd8143ad4cfc04
https://doi.org/10.14801/jkiit.2021.19.12.115
https://doi.org/10.14801/jkiit.2021.19.12.115
Publikováno v:
The Journal of Korean Institute of Information Technology. 19:45-52
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01d1d630d8bc2708d2b787535e178bb9
https://doi.org/10.14801/jkiit.2021.19.3.45
https://doi.org/10.14801/jkiit.2021.19.3.45
Publikováno v:
The Journal of Korean Institute of Information Technology. 19:147-156
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::56eb4a6b7b57c43b4e98cfd9a7cddafa
https://doi.org/10.14801/jkiit.2021.19.1.147
https://doi.org/10.14801/jkiit.2021.19.1.147
Publikováno v:
The Journal of Korean Institute of Information Technology. 19:63-70
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12ae1c7a2bfcdbb1e48d4e5f18eba555
https://doi.org/10.14801/jkiit.2021.19.1.63
https://doi.org/10.14801/jkiit.2021.19.1.63
Publikováno v:
Journal of Electrical Engineering and Technology. 11:775-780
This induced voltage measurement test and electromagnetic field simulation are related to the possibility of control signal malfunction by power line. Through an experiment, this research analyzed whether the voltage causing control malfunction accor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::412577dcbe6a4a2f003d4288157cb16e
https://doi.org/10.5370/jeet.2016.11.3.775
https://doi.org/10.5370/jeet.2016.11.3.775
Autor:
Dae-Nyeon Kim
Publikováno v:
Journal of the Korean Institute of Illuminating and Electrical Installation Engineers. 30:37-42
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50430bb8d4c141209a81993c804d0224
https://doi.org/10.5207/jieie.2016.30.2.037
https://doi.org/10.5207/jieie.2016.30.2.037
Publikováno v:
Journal of the Korean Institute of Illuminating and Electrical Installation Engineers. 27:9-14
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8162a275917451c1c9fb538afeb1618
https://doi.org/10.5207/jieie.2013.27.10.009
https://doi.org/10.5207/jieie.2013.27.10.009