Zobrazeno 1 - 10
of 52
pro vyhledávání: '"DaCosta, Luis"'
Machine learning techniques are attractive options for developing highly-accurate automated analysis tools for nanomaterials characterization, including high-resolution transmission electron microscopy (HRTEM). However, successfully implementing such
Externí odkaz:
http://arxiv.org/abs/2309.06122
Neural networks are promising tools for high-throughput and accurate transmission electron microscopy (TEM) analysis of nanomaterials, but are known to generalize poorly on data that is "out-of-distribution" from their training data. Given the limite
Externí odkaz:
http://arxiv.org/abs/2306.11853
Autor:
Pelz, Philipp M, Rakowski, Alexander, DaCosta, Luis Rangel, Savitzky, Benjamin H, Scott, Mary C, Ophus, Colin
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the conventional multi
Externí odkaz:
http://arxiv.org/abs/2104.01496
Autor:
Hong, Xuhao, Zeltmann, Steven E, Savitzky, Benjamin H, DaCosta, Luis Rangel, Mueller, Alexander, Minor, Andrew M, Bustillo, Karen, Ophus, Colin
Publikováno v:
Microsc Microanal 27 (2021) 129-139
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged electron pro
Externí odkaz:
http://arxiv.org/abs/2009.09134
Autor:
Savitzky, Benjamin H, Hughes, Lauren A, Zeltmann, Steven E, Brown, Hamish G, Zhao, Shiteng, Pelz, Philipp M, Barnard, Edward S, Donohue, Jennifer, DaCosta, Luis Rangel, Pekin, Thomas C., Kennedy, Ellis, Janish, Matthew T, Schneider, Matthew M, Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Ercius, Peter, Scott, Mary, Ciston, Jim, Minor, Andrew M, Ophus, Colin
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D im
Externí odkaz:
http://arxiv.org/abs/2003.09523
Akademický článek
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Publikováno v:
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-5, 5p
Autor:
Cho, Min Gee, Oh, Myoung Hwan, Sytwu, Katherine, DaCosta, Luis Rangel, Groschner, Catherine, Scott, Mary C
Publikováno v:
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p
Akademický článek
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Autor:
Clark, Alexander Smith, Johnson, Eric T., Chen, Zhi, Eiden, Kiran, Zingale, Michael, Boyd, Brendan, Johnson, Parker T., DaCosta, Luis Rangel
Publikováno v:
Journal of Physics: Conference Series; 2024, Vol. 2742 Issue 1, p1-10, 10p