Zobrazeno 1 - 10
of 201
pro vyhledávání: '"DURAND, CÉDRIC"'
Autor:
Bhaskar, Arun, Philippe, Justine, Okada, Etienne, Braud, Flavie, Robillard, Jean-François, Durand, Cédric, Gianesello, Frédéric, Gloria, Daniel, Gaquière, Christophe, Dubois, Emmanuel
With the evolution of radio frequency (RF)/microwave technology, there is a demand for circuits which are able to meet highly challenging RF frontend specifications. Silicon-on-insulator (SOI) technology is one of the leading platforms for upcoming w
Externí odkaz:
http://arxiv.org/abs/2109.09452
Publikováno v:
In Journal of Cleaner Production 15 January 2024 437
Autor:
Sabatier, Franck, Durand, Cédric, Drouin, Dominique, Pioro-Ladrière, Michel, Ndagijimana, Fabien, Galy, Philippe
Publikováno v:
In Solid State Electronics January 2024 211
Autor:
Bhaskar, Arun, Philippe, Justine, Braud, Flavie, Okada, Etienne, Avramovic, Vanessa, Robillard, Jean-François, Durand, Cédric, Gloria, Daniel, Gaquière, Christophe, Dubois, Emmanuel
A femtosecond laser is a powerful tool for micromachining of silicon. In this work, large-area laser ablation of crystalline silicon is comprehensively studied using a laser source of pulse width 300 fs at two wavelengths of 343 nm and 1030 nm. We de
Externí odkaz:
http://arxiv.org/abs/2008.13205
Autor:
Bhaskar, Arun, Philippe, Justine, Avramovic, Vanessa, Braud, Flavie, Robillard, Jean-François, Durand, Cédric, Gloria, Daniel, Gaquiere, Christophe, Dubois, Emmanuel
High Q-factor inductors are critical in designing high performance RF/microwave circuits on SOI technology. Substrate losses is a key limiting factor when designing inductors with high Q-factors. In this context, we report a substrate engineering met
Externí odkaz:
http://arxiv.org/abs/2008.09030
Autor:
Althouse, Jeffrey, Cahen-Fourot, Louison, Carballa-Smichowski, Bruno, Durand, Cédric, Knauss, Steven
Publikováno v:
In World Development October 2023 170
Akademický článek
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Autor:
Berlingard, Quentin, Lugo-Alvarez, Jose, Contamin, Lauriane, Durand, Cédric, Galy, Philippe, Juge, Andre, De Franceschi, Silvano, Vinet, Maud, Meunier, Tristan, Cassé, Mikaël, Gaillard, Fred
Publikováno v:
In Solid State Electronics August 2022 194