Zobrazeno 1 - 10
of 40
pro vyhledávání: '"DM Gilliam"'
Autor:
FA Garner, BM Oliver, LR Greenwood, DL Porter, T Allen, DW Vehar, DM Gilliam, JM Adams, SW Dean
Publikováno v:
Journal of ASTM International. 4:100342
Five hexagonal ducts constructed from AISI 304 stainless steel in the annealed state were removed from rows 8–14 of the EBR-II fast reactor after many years of irradiation to study the effect of atomic displacement rate on void swelling. For this o
Autor:
Hoogerheide SF; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Caylor J; University of Tennessee, Knoxville, TN 37996, USA., Adamek ER; University of Tennessee, Knoxville, TN 37996, USA., Anderson ES; Indiana University, Bloomington, IN 47408, USA., Biswas R; Tulane University, New Orleans, LA 70118, USA., Chavali SM; University of Maryland, College Park, MD 20742, USA., Crawford B; Gettysburg College, Gettysburg, PA 17325, USA., DeAngelis C; Tulane University, New Orleans, LA 70118, USA., Dewey MS; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Fomin N; University of Tennessee, Knoxville, TN 37996, USA., Gilliam DM; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Grammer KB; Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA., Greene GL; University of Tennessee, Knoxville, TN 37996, USA.; Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA., Haun RW; Tulane University, New Orleans, LA 70118, USA., Ivanov JA; Georgetown University, Washington, DC 20057, USA., Li F; Gettysburg College, Gettysburg, PA 17325, USA., Mulholland J; University of Tennessee, Knoxville, TN 37996, USA., Mumm HP; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Nico JS; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Snow WM; Indiana University, Bloomington, IN 47408, USA., Valete D; Gettysburg College, Gettysburg, PA 17325, USA., Wietfeldt FE; Tulane University, New Orleans, LA 70118, USA., Yue AT; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Publikováno v:
EPJ web of conferences [EPJ Web Conf] 2019; Vol. 219.
Autor:
Yue AT; National Institute of Standards and Technology, Gaithersburg, MD 20899, United States of America., Anderson ES; Indiana University, Bloomington, IN 47408, United States of America., Dewey MS; National Institute of Standards and Technology, Gaithersburg, MD 20899, United States of America., Gilliam DM; National Institute of Standards and Technology, Gaithersburg, MD 20899, United States of America., Greene GL; University of Tennessee, Knoxville, TN 37996, United States of America.; Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States of America., Laptev AB; Los Alamos National Laboratory, Los Alamos, NM 87545, United States of America., Nico JS; National Institute of Standards and Technology, Gaithersburg, MD 20899, United States of America., Snow WM; Indiana University, Bloomington, IN 47408, United States of America.
Publikováno v:
Metrologia [Metrologia] 2018; Vol. 55.
Autor:
Yue AT; Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20742, USA and National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA and University of Tennessee, Knoxville, Tennessee 37996, USA., Dewey MS; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Gilliam DM; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Greene GL; University of Tennessee, Knoxville, Tennessee 37996, USA and Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA., Laptev AB; Tulane University, New Orleans, Louisiana 70118, USA and Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA., Nico JS; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Snow WM; Indiana University, Bloomington, Indiana 47408, USA., Wietfeldt FE; Tulane University, New Orleans, Louisiana 70118, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2013 Nov 27; Vol. 111 (22), pp. 222501. Date of Electronic Publication: 2013 Nov 27.
Autor:
Wietfeldt FE; Tulane University, New Orleans, LA 70118., Dewey MS; National Institute of Standards and Technology, Gaithersburg, MD 20899., Gilliam DM; National Institute of Standards and Technology, Gaithersburg, MD 20899., Nico JS; National Institute of Standards and Technology, Gaithersburg, MD 20899., Fei X; Indiana University, Bloomington, IN 47408., Snow WM; Indiana University, Bloomington, IN 47408., Greene GL; University of Tennessee/Oak Ridge National Laboratory, Knoxville, TN 37996., Pauwels J; European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, 2440 Geel, Belgium., Eykens R; European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, 2440 Geel, Belgium., Lamberty A; European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, 2440 Geel, Belgium., Van Gestel J; European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, 2440 Geel, Belgium.
Publikováno v:
Journal of research of the National Institute of Standards and Technology [J Res Natl Inst Stand Technol] 2005 Aug 01; Vol. 110 (4), pp. 327-31. Date of Electronic Publication: 2005 Aug 01 (Print Publication: 2005).
Autor:
Nico JS; National Institute of Standards and Technology, Gaithersburg, MD 20899-8461., Arif M; National Institute of Standards and Technology, Gaithersburg, MD 20899-8461., Dewey MS; National Institute of Standards and Technology, Gaithersburg, MD 20899-8461., Gentile TR; National Institute of Standards and Technology, Gaithersburg, MD 20899-8461., Gilliam DM; National Institute of Standards and Technology, Gaithersburg, MD 20899-8461., Huffman PR; National Institute of Standards and Technology, Gaithersburg, MD 20899-8461., Jacobson DL; National Institute of Standards and Technology, Gaithersburg, MD 20899-8461., Thompson AK; National Institute of Standards and Technology, Gaithersburg, MD 20899-8461.
Publikováno v:
Journal of research of the National Institute of Standards and Technology [J Res Natl Inst Stand Technol] 2005 Jun 01; Vol. 110 (3), pp. 137-44. Date of Electronic Publication: 2005 Jun 01 (Print Publication: 2005).
Autor:
Dewey MS; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA., Gilliam DM, Nico JS, Wietfeldt FE, Fei X, Snow WM, Greene GL, Pauwels J, Eykens R, Lamberty A, Van Gestel J
Publikováno v:
Physical review letters [Phys Rev Lett] 2003 Oct 10; Vol. 91 (15), pp. 152302. Date of Electronic Publication: 2003 Oct 10.