Fiabilité des LED Infrarouges. [elektronicky zdroj]

Autor: Deshayes, Yannick

Externí odkaz: Kolekce e-knih KNAV (Registrovani uzivatele: plny text online 5 minut, dalsi pristup na vyzadani. Registered users: full text online 5 minutes, further access on requests.)

Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage

Autor: Baillot, Raphael, Deshayes, Yannick, Ousten, Yves, Bechou, Laurent

Publikováno v: In Microelectronics Reliability August-September 2015 55(9-10):1759-1764

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Area downsizing effects on electrical performance and robustness of triple junction solar cells for CPV applications

Autor: Albert, Pierre, jaouad, abdelatif, Volatier, Maite, Valdivia, Christopher E., Deshayes, Yannick, Bechou, Laurent, Aimez., Vincent, Darnon, Maxime

Publikováno v: International Symposium on Reliability of Optoelectronics System
International Symposium on Reliability of Optoelectronics System, Nov 2019, Toulouse, France

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::62e80fa37252d78d63ce076a9fbf02c5
https://hal.archives-ouvertes.fr/hal-02443117

Fiabilité des LED infrarouges : méthodologie d’évaluation par la physique des défaillances

Autor: Deshayes, Yannick, Bechou, Laurent

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______166::6f394690aa57b0981775b142e6cb6ac4
https://hal.archives-ouvertes.fr/hal-01711168