Zobrazeno 1 - 10
of 129
pro vyhledávání: '"DESHAYES, Y."'
Publikováno v:
In Microelectronics Reliability November 2023 150
Publikováno v:
In Microelectronics Reliability September 2017 76-77:579-583
Autor:
Del Vecchio, P., Curutchet, A., Deshayes, Y., Bettiati, M., Laruelle, F., Labat, N., Béchou, L.
Publikováno v:
In Microelectronics Reliability August-September 2015 55(9-10):1741-1745
Publikováno v:
In Microelectronics Reliability September-November 2013 53(9-11):1514-1518
Autor:
Baillot, R., Deshayes, Y., Bechou, L., Buffeteau, T., Pianet, I., Armand, C., Voillot, F., Sorieul, S., Ousten, Y.
Publikováno v:
In Microelectronics Reliability 2010 50(9):1568-1573
Autor:
Albert, P., Deshayes, Y., Hamon*, G., JAOUAD, A., VOLATIER, M., Aimez, V., Bechou, L., Darnon, M.
Publikováno v:
17th Conference on Concentrated Photovoltaics Systems (CPV17)
17th Conference on Concentrated Photovoltaics Systems (CPV17), Apr 2021, Freiburg, Germany
17th Conference on Concentrated Photovoltaics Systems (CPV17), Apr 2021, Freiburg, Germany
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::eb662392b8c3f18090d14da2a2a655b9
https://hal.archives-ouvertes.fr/hal-03349727
https://hal.archives-ouvertes.fr/hal-03349727
Publikováno v:
In Optics and Laser Technology 2008 40(4):589-601
Autor:
Deshayes, Y., Bord, I., Barreau, G., Aiche, M., Moretto, P.H., Béchou, L., Roehrig, A.C., Ousten, Y.
Publikováno v:
In Microelectronics Reliability 2008 48(8):1354-1360
Autor:
Bourqui, M.L., Béchou, L., Gilard, O., Deshayes, Y., Vecchio, P. Del, How, L.S., Rosala, F., Ousten, Y., Touboul, A.
Publikováno v:
In Microelectronics Reliability 2008 48(8):1202-1207
Autor:
Huyghe, S., Bechou, L., Zerounian, N., Deshayes, Y., Aniel, F., Denolle, A., Laffitte, D., Goudard, J.L., Danto, Y.
Publikováno v:
In Microelectronics Reliability 2005 45(9):1593-1599