Zobrazeno 1 - 10
of 95
pro vyhledávání: '"D.W. Langer"'
Autor:
E. Niemann, Robert P. Devaty, L.B. Rowland, Wolfgang J. Choyke, G. Rutsch, D.W. Langer, Frank Wischmeyer
Publikováno v:
Materials Science Forum. :733-736
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08c50237d964468e50d5ca49861c9e6d
https://doi.org/10.4028/www.scientific.net/msf.338-342.733
https://doi.org/10.4028/www.scientific.net/msf.338-342.733
Autor:
D.W. Langer, Dong-Sun Min
Publikováno v:
IEEE Journal of Solid-State Circuits. 34:856-865
To provide reliable scaled DRAMs, new multiple twisted dataline techniques are proposed and analyzed. Their effectiveness in reducing both the bitline (BL) and wordline (WL) coupling noises in scaled DRAM's was evaluated by means of soft-error-rate m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02d14b5c42b061915a8d4695d5fb6e7f
https://doi.org/10.1109/4.766820
https://doi.org/10.1109/4.766820
Publikováno v:
Materials Science Forum. :517-520
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5a612764e36e20740080f79c554a6db
https://doi.org/10.4028/www.scientific.net/msf.264-268.517
https://doi.org/10.4028/www.scientific.net/msf.264-268.517
Publikováno v:
Journal of Applied Physics. 84:2062-2064
The Hall scattering coefficient rH determines the relationship between the measurable Hall coefficient RH and the free carrier concentration. Reliable knowledge of rH is necessary for the precise interpretation of Hall measurements and to validate th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ecbb5530c390f5c2ae54cbfdd51287a
https://doi.org/10.1063/1.368266
https://doi.org/10.1063/1.368266
Autor:
Dong-Sun Min, D.W. Langer
Publikováno v:
Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327).
New multiple twisted data line techniques to reduce both bit line (BL) and word line (WL) coupling noises in scaled embedded DRAMs are proposed and analyzed. An improved noise/signal ratio resulting from the application of the proposed techniques is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42d39f6af1889f61fce3f70993433cda
https://doi.org/10.1109/cicc.1999.777280
https://doi.org/10.1109/cicc.1999.777280
Autor:
D.W. Langer, H. ur-Rahman
Publikováno v:
Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements.
Presents a direct approach to precisely measure changes in refractive index (/spl Delta/n) of GaAs/AlGaAs Multiple Quantum Well (MQW) wave guide structures as a function of applied electric field across the MQW layers. The results of /spl Delta/n(E)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b8d2139b0dc994fa35d2f60c4c5cd81
https://doi.org/10.1109/cpem.1996.547054
https://doi.org/10.1109/cpem.1996.547054
Publikováno v:
LEOS '95. IEEE Lasers and Electro-Optics Society 1995 Annual Meeting. 8th Annual Meeting. Conference Proceedings.
The measurement of the amplitude and phase of electric fields on high voltage transmission lines is important for several reasons including: a) metering and determination of power flow, b) protective relaying, and c) fault sensing. The work reported
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae83b4f636fd9800b4594373cabdcfbb
https://doi.org/10.1109/leos.1995.484702
https://doi.org/10.1109/leos.1995.484702
Publikováno v:
Electronics Letters. 34:1296
A new multiple twisted data line technique to reduce both bit-line and word-line coupling noises is proposed and demonstrated. An improved noise/signal ratio resulting from the application of the proposed technique is confirmed by soft-error rate tes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3188b44032e3614dcb9e5ee38eff1b0
https://doi.org/10.1049/el:19980933
https://doi.org/10.1049/el:19980933
Autor:
D.W. Langer, Dong-Sun Min
Publikováno v:
Electronics Letters. 33:1380
A new twisted bit-line (TBL) technique is presented to reduce bit-line coupling noise for multi-gigabit DRAMs. Sufficient noise reduction effects have been monitored through soft-error rate measurement on test chips using the proposed TBL technique.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d3aa181a7a27f1bc647f407d29ecc3c
https://doi.org/10.1049/el:19970923
https://doi.org/10.1049/el:19970923
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