Experimental determination of base resistance contribution for point-like contacted c-Si solar cells using impedance spectroscopy analysis

Autor: Joaquim Puigdollers, Albert Orpella, J. Muñoz, Isidro Martín, Cristobal Voz, Juan M. López-González, D.C. Sinde, Ramon Alcubilla, Pablo Ortega

Publikováno v: Recercat. Dipósit de la Recerca de Catalunya
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UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)

One of the most common strategies in high-efficiency crystalline silicon (c-Si) solar cells for the rear surface is the combination of a dielectric passivation with a point-like contact to the base. In such devices, the trade-off between surface pass

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::560aa6801f7547f58eb1d8a1003f154d
https://hdl.handle.net/2117/84986