Zobrazeno 1 - 10
of 49
pro vyhledávání: '"D.A. Ahmari"'
Publikováno v:
ECS Transactions. 33:849-857
The semiconductor industry is being pushed to develop smaller and faster devices as well as increase functionality. As such, a key part of the long-term technology roadmap will include integrating disparate semiconductor materials to provide superior
Publikováno v:
IEEE Transactions on Electron Devices. 46:634-640
This work describes the temperature dependence of the DC and small-signal performance of InGaP/GaAs heterojunction bipolar transistors (HBT's) with different collector thicknesses. Detailed analyses of the small-signal performance and the temperature
Autor:
Shawn G. Thomas, Papu D. Maniar, Q.J. Hartmann, Xiuling Li, D.A. Ahmari, Eric S. Johnson, B. Roof, Clarence J. Tracy
Publikováno v:
IEEE Electron Device Letters. 26:438-440
In this letter, we report the first demonstration of InGaP/GaAs heterojunction bipolar transistors (HBTs) on germanium-on-insulator (GOI) substrates. We have performed physical characterization of the epitaxial layers to verify the high quality of th
Publikováno v:
Solid-State Electronics. 38:2017-2021
InGaP GaAs heterojunction bipolar transistors with various collector structures are compared. The dependence of d.c. device characteristics on the thickness of the n− GaAs spacer in the collector of composite collector devices is presented. Results
Autor:
Q.J. Hartmann, G. E. Stillman, Judith E. Baker, M. Hattendorf, D. F. Lemmerhirt, D.A. Ahmari, Qing-Zheng Yang
Publikováno v:
Applied Physics Letters. 72:3479-3481
A high concentration of hydrogen in the alloy ambient slows the formation of PdGe contacts and increases the resistance of the PdGe to GaAs etchants. The effects of alloy ambient on alloy formation, specific contact resistance, and chemical reactivit
Publikováno v:
IEEE Electron Device Letters. 18:559-561
To improve electrical isolation and simplify the heterojunction bipolar transistor (HBT) fabrication process, a semi-insulating InGaP buffer layer has been employed in an InGaP/GaAs HBT. Data is presented that demonstrates this buffer layer serves as
Autor:
T. Horton, Judith E. Baker, Q.J. Hartmann, M. T. Fresina, Nathan F. Gardner, D.A. Ahmari, A. P. Curtis, G. E. Stillman
Publikováno v:
Applied Physics Letters. 70:1822-1824
High-resistivity unintentionally-doped In0.49Ga0.51P lattice matched to GaAs has been grown via low-pressure metalorganic chemical vapor deposition at a reduced growth temperature. These layers have excellent surface quality and are single crystal. T
Autor:
J. I. Malin, Milton Feng, G. E. Stillman, D. K. Sengupta, H. C. Liu, S. L. Jackson, Lianhe Li, H. C. Kuo, S. Thomas, D.A. Ahmari, Yun-Chorng Chang
Publikováno v:
Applied Physics Letters. 69:3209-3211
Lattice-matched InGaAs/InP quantum well intersubband photodetectors (QWIPs) have been grown on an InP substrate by gas source molecular beam epitaxy. Detection at 4.55 μm was observed for a narrow well p-type InGaAs QWIP which, when complimented by
Autor:
C. A. Martino, Milton Feng, D.A. Ahmari, M.T. Fresina, Douglas W. Barlage, S. Thomas, G. E. Stillman
Publikováno v:
Journal of Electronic Materials. 25:1637-1639
We have demonstrated a high-speed InP/lnGaAs heterojunction bipolar transistor with nonalloyed TiPtAu contacts on n+-InP emitter and collector contacting layers. The use of SiBr4 as a silicon doping source enabled the formation of low resistance (pc
Autor:
Douglas W. Barlage, Q.J. Hartmann, Milton Feng, P.J. Mares, M.T. Fresina, D.A. Ahmari, G. E. Stillman
Publikováno v:
IEEE Electron Device Letters. 17:226-228
A self-aligned InGaP/GaAs heterojunction bipolar transistor with a compositionally graded In/sub x/Ga/sub 1-x/As base has been demonstrated with f/sub T/=83 GHz and f/sub max/=197 GHz. To our knowledge, these results are the highest reported for both