Zobrazeno 1 - 5
of 5
pro vyhledávání: '"D. Yu. Prokhorov"'
Autor:
N. N. Speranskiĭ, S.V. Mirnov, A. G. Alekseev, A. M. Belov, A. S. Prokhorov, D. Yu. Prokhorov
Publikováno v:
Plasma Physics Reports. 33:613-621
The sudden appearance of bright and dark spots against the background lithium emission from the central regions of the plasma column was observed during major plasma disruptions in the T-11M tokamak with a lithium limiter. The measurements were perfo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::624ac7ab5fd0d56d55f99ad31d2789c0
https://doi.org/10.1134/s1063780x07080016
https://doi.org/10.1134/s1063780x07080016
Publikováno v:
Crystallography Reports. 51:754-760
The structure of porous layers fabricated on the surface of an InP(001) semiconductor wafer by electrochemical oxidation has been studied by triple-crystal X-ray diffractometry. It is shown that, depending on the probe potential (current density), co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b9191be2695d965958f0a341cf3d92c
https://doi.org/10.1134/s106377450605004x
https://doi.org/10.1134/s106377450605004x
Autor:
D. Yu. Prokhorov, A. G. Sutyrin
Publikováno v:
Crystallography Reports. 51:570-576
The method of high-resolution X-ray reflectometry with application of the genetic Differential Evolution algorithm for global minimization of the error function is developed. The optimization of the computational process is performed by combining the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68b98ebf76c1f939e9f3754448fa0d75
https://doi.org/10.1134/s1063774506040055
https://doi.org/10.1134/s1063774506040055
Autor:
D. Yu. Prokhorov, Andrey A. Lomov, Yu. V. Khabarov, Imamov Rafik M, G. B. Galiev, A. G. Sutyrin, M. A. Chuev
Publikováno v:
Crystallography Reports. 50:739-750
The structural properties of multiplayer AlxGa1−xAs/GaAs/AlxGa1−xAs systems (x ≈ 0.2) grown on GaAs(001) substrates are studied by the methods of double-crystal X-ray diffractometry and reflectometry. The depth profiles of deformation, amorphiz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8c646f106afda26b7a9e93c069b6d99f
https://doi.org/10.1134/1.2049390
https://doi.org/10.1134/1.2049390
Autor:
A. G. Sutyrin, A. A. Nikulin, Andrey A. Lomov, A.A. Fedyanin, Oleg A. Aktsipetrov, V. G. Avramenko, A.F. Pudonin, Tatyana V. Dolgova, D. Yu. Prokhorov
Publikováno v:
Physical Review B. 73
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c4bb4ff46386aa6681586800beca2d2
https://doi.org/10.1103/physrevb.73.155321
https://doi.org/10.1103/physrevb.73.155321