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pro vyhledávání: '"D. W. Wittig"'
Autor:
C. Hirko, R. Yaari, Ulrich Baur, D. W. Wittig, J. A. Kyle, Orazio P. Forlenza, Donato O. Forlenza, Mary P. Kusko, Bryan J. Robbins, Gerard M. Salem, Franco Motika, S. Michnowski, T.G. Foote, Ronald J. Frishmuth
Publikováno v:
IBM Journal of Research and Development. 53:5:1-5:11
For the first time in the history of the IBM System z™ family of mainframes, System z10™ processor chips are tested by both structural and functional means. This complementary strategy starts at wafer test and is consistent through system test. I
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44b3f6146dbb85fd9c1f8c9288b41828
https://doi.org/10.1147/jrd.2009.5388583
https://doi.org/10.1147/jrd.2009.5388583
