Zobrazeno 1 - 10
of 46
pro vyhledávání: '"D. V. Taylor"'
Autor:
Ichiro Fujii, D. V. Taylor, Susan Trolier-McKinstry, Dragan Damjanovic, Eunki Hong, Nazanin Bassiri-Gharb
Publikováno v:
Journal of Electroceramics. 19:49-67
In bulk ferroelectric ceramics, extrinsic contributions associated with motion of domain walls and phase boundaries are a significant component of the measured dielectric and piezoelectric response. In thin films, the small grain sizes, substantial r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::084ba163f0d4218a99605a0903649f98
https://doi.org/10.1007/s10832-007-9001-1
https://doi.org/10.1007/s10832-007-9001-1
Autor:
Scott R. Summerfelt, K. K. Singh, D. Carl, S. Hunter, Jun Amano, D. Ritchey, D. V. Taylor, Stephen R. Gilbert, Theodore S. Moise, Tomoyuki Sakoda, C. Kazemi, B. Bierman, C. Chi, S. Aggarwal
Publikováno v:
Journal of Applied Physics. 93:1713-1717
To realize the full potential of high density embedded ferroelectric memory, ferroelectric film thickness must be scaled below 100 nm to ensure that the capacitor operating voltage is compatible with advanced, low voltage logic transistors. In this a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7681948af2f58e1f547f128956104c49
https://doi.org/10.1063/1.1534380
https://doi.org/10.1063/1.1534380
Autor:
F. Chu, Laurent Sagalowicz, P. D. Martin, Nava Setter, Dragan Damjanovic, M.D. Maeder, D. V. Taylor
Publikováno v:
Boletín de la Sociedad Española de Cerámica y Vidrio. 38:538-544
The paper discusses different possibilities for controlling piezoelectric properties of ferroelectric materials and devices. The piezoelectric properties engineering can be made on different scales. Tuning of the piezoelectric response by controlling
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::713158287fd3c48367441303b1427691
https://doi.org/10.3989/cyv.1999.v38.i6.888
https://doi.org/10.3989/cyv.1999.v38.i6.888
Publikováno v:
Ferroelectrics. 224:235-242
The effective piezoelectric coefficient e(31) has been measured on sol-gel processed Pb(ZrxTi1-x)O-3 thin films with Zr concentrations ranging from 45 to 60%. The largest value was observed at 45% Zr, although dielectric constant and effective d(33)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5485693d6b8565fce5d2f307c148d629
https://doi.org/10.1080/00150199908210572
https://doi.org/10.1080/00150199908210572
Autor:
Dragan Damjanovic, D. V. Taylor
Publikováno v:
Scopus-Elsevier
The dielectric and piezoelectric response of ferroelectric thin films and ceramics was investigated as a function of the driving field amplitude. Detailed analysis of the amplitude and phase angle of the third harmonic of the dielectric displacement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ed9d7a6e2c32cb961020a6be63b25ac0
https://doi.org/10.1080/00150199908016448
https://doi.org/10.1080/00150199908016448
Publikováno v:
ResearcherID
Scopus-Elsevier
Scopus-Elsevier
It was recently suggested, basing on the analysis of a wide range of macroscopic experimental results([1-4]), that fatigue in ferroelectric thin film capacitors, particularly in the case of PZT with metallic electrodes (Pt), must be related to the fr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98b09265367b3e736bdd1723d1d55f00
https://doi.org/10.1080/10584589808208045
https://doi.org/10.1080/10584589808208045
Publikováno v:
Journal of Sol-Gel Science and Technology. 13:813-820
Sol-gel spin coating has a low ‘thermal budget’, is cheap compared to vacuum-based techniques and is now routinely used to produce dense, pore-free ferroelectric films. PbZrx Ti(1 − x)O3 (PZT) is utilized in most applications because it has a l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75bdda99419da6d1f7b410fd97ac5562
https://doi.org/10.1023/a:1008690316261
https://doi.org/10.1023/a:1008690316261
Publikováno v:
Integrated Ferroelectrics. 15:317-324
Piezoelectric and dielectric aging was studied in Pb(Zr,Ti)O3 (PZT) thin films and bulk ceramics. It was found that piezoelectric aging in thin films obeys the logarithmic time dependence with the relative aging rate much higher than that of the diel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5229fe4b5c4048c324869963337578e
https://doi.org/10.1080/10584589708015722
https://doi.org/10.1080/10584589708015722
Publikováno v:
Review of Scientific Instruments. 67:1935-1941
Interferometric measurements of electric field‐induced displacements in piezoelectric thin films using single‐beam and double‐beam optical detection schemes are reported. It is shown that vibrational response measured with a single‐beam inter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::404ae41a6d9adf91c183e3564ed318b1
https://doi.org/10.1063/1.1147000
https://doi.org/10.1063/1.1147000
Autor:
Paul Muralt, Nava Setter, Keith G. Brooks, D. V. Taylor, Andrei L. Kholkin, Thomas Maeder, Enrico Colla, Markus Kohli
Publikováno v:
Microelectronic Engineering. 29:261-264
Degradation of piezoelectric properties has been studied in ferroelectric PZT films by means of optical interferometry. The degradation under de bias and aging of poled films have been observed. The decay of piezoelectric coefficient with time is des
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fbd14729d5719a03ae8b91127431a99a
https://doi.org/10.1016/0167-9317(95)00157-3
https://doi.org/10.1016/0167-9317(95)00157-3