Zobrazeno 1 - 10
of 13
pro vyhledávání: '"D. V. Tarkhin"'
Autor:
I. A. Sheremet, D. V. Tarkhin, V. Y. Davydov, Alexander N. Smirnov, Y. G. Shreter, N. I. Bochkareva, Andrey Leonidov, Y. S. Lelikov, M. V. Virko, F. E. Latishev, Andrey Zubrilov, Vladislav Voronenkov, A. V. Pinchuk, V. S. Kogotkov, R. I. Gorbunov
Publikováno v:
Semiconductors. 51:115-121
The intense absorption of CO2 laser radiation in sapphire is used to separate GaN films from GaN templates on sapphire. Scanning of the sapphire substrate by the laser leads to the thermal dissociation of GaN at the GaN/sapphire interface and to the
Autor:
Yu. T. Rebane, D. V. Tarkhin, I. A. Martynov, N. I. Bochkareva, Yu. S. Lelikov, R. I. Gorbunov, Yu. G. Shreter
Publikováno v:
Semiconductors. 41:87-93
The spectra of electroluminescence, photoluminescence, and photocurrent for the In0.2Ga0.8N/GaN quantum-well structures are studied to clarify the causes for the reduction in quantum efficiency with increasing forward current. It is established that
Autor:
D. V. Tarkhin, Yu. T. Rebane, N. I. Bochkareva, R. I. Gorbunov, A. A. Efremov, D. A. Lavrinovich, Yu. G. Shreter
Publikováno v:
Semiconductors. 40:605-610
The heat model of a light-emitting diode (LED) with an InGaN/GaN quantum well (QW) in the active region is considered. Effects of the temperature and drive current, as well as of the size and material of the heat sink on the light output and efficien
Autor:
Alan Gott, Evgeny Zhirnov, N. I. Bochkareva, Wang Nang Wang, Yu. G. Shreter, Sergei Stepanov, D. V. Tarkhin
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 23:687-692
ICP etching of GaN, Al0.1Ga0.9N, and a laser diode (LD) structure with Cl2–Ar plasma assisted by Si coverplate material was systematically studied. The influence of the process pressure, rf and ICP power on the etch rate, surface morphology, and se
Publikováno v:
Physics of the Solid State. 43:169-175
Corrosion precursors in the form of microgrooves appearing on the elastically compressed surface of a silicon plate under etching are investigated. No corrosion precursors are observed on the elastically stretched surface. This distinguishes the obse
Publikováno v:
Physics of the Solid State. 41:1295-1297
An unusual relief in the form of linear defects resembling quasicracks or grooves was observed on a compressionally stressed surface of a bent silicon surface subjected to chemical etching. The average distance between the forming defects was determi
Publikováno v:
Springer Proceedings in Physics ISBN: 9783642763878
Springer Proceedings in Physics
Springer Proceedings in Physics
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cbe44640d72839d64c4c159219f46262
https://doi.org/10.1007/978-3-642-76385-4_36
https://doi.org/10.1007/978-3-642-76385-4_36
Publikováno v:
The Soviet Journal of Atomic Energy. 11:861-864
Laboratory models of surface-barrier and diffusion-type silicon n-p counters were developed which were suitable for nuclear spectrometry. The counters have linear pulse height-energy dependence for particles with 60 μ paths (in particular, for α-pa
Publikováno v:
Soviet Journal of Quantum Electronics. 8:797-799
A new very fast noise-immune uncooled photodetector was developed on the basis of the intraband photoconductivity. The detector was found to have a time resolution of 2×1010 sec and an output voltage up to 8 V. The dependence of the relative photoco
Publikováno v:
Soviet Atomic Energy. 16:440-442