Zobrazeno 1 - 9
of 9
pro vyhledávání: '"D. T. Fewer"'
Publikováno v:
Optics Communications. 152:393-402
We derive a general theory of imaging for the fluorescence direct-view microscope (DVM) in terms of the system's incoherent optical transfer function. Particular attention is given to both the form of the in-focus transfer function and the optical se
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61ba7b1cd40995f82f082f91bd4c82a1
https://doi.org/10.1016/s0030-4018(98)00174-6
https://doi.org/10.1016/s0030-4018(98)00174-6
Publikováno v:
Journal of Microscopy. 187:54-61
We present a comparison between theoretical and experimental results for the axial response to a plane mirror specimen of the direct-view microscope employing multiple-pinhole arrays. The effects of pinhole size, pinhole spacing and array geometry ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d1714db284bf8446d1ab661a29d9ad62
https://doi.org/10.1046/j.1365-2818.1997.2080772.x
https://doi.org/10.1046/j.1365-2818.1997.2080772.x
Autor:
Tomonori Hino, S. Taniguchi, C. Jordan, D. T. Fewer, Petteri Uusimaa, Eithne M. McCabe, Markus Pessa, Kazushi Nakano, John F. Donegan, Akira Ishibashi
Publikováno v:
SPIE Proceedings.
Confocal photoluminescence imaging is an important tool in the investigation of recombination in semiconductors and in the characterization of material growth. This characterization is particularly important for II-VI wide band-gap semiconductors whe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b7b176c84866685052aa82e844739ea
https://doi.org/10.1117/12.347591
https://doi.org/10.1117/12.347591
Autor:
Tomonori Hino, A. Huynh, S. Taniguchi, C. Jordan, Akira Ishibashi, F. P. Logue, Eithne M. McCabe, K. Nakano, D. T. Fewer, John F. Donegan
PUBLISHED
Defect annealing under intense pulsed optical excitation has been observed in a II?VI laser diode structure at room temperature. More than one order of magnitude increase in photoluminescence intensity has been obtained when the anneal
Defect annealing under intense pulsed optical excitation has been observed in a II?VI laser diode structure at room temperature. More than one order of magnitude increase in photoluminescence intensity has been obtained when the anneal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::34f1087904ddf994aa3e0e97518544d1
Publikováno v:
SPIE Proceedings.
Experimental results are given for the optical sectioning characteristics of finite-sized, multiple-aperture arrays in brightfield direct-view microscopy. We also present a theoretical model for the brightfield direct-view microscope (DVM). This allo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b0e77dbb2e89350f9fb0175512026e7
https://doi.org/10.1117/12.271255
https://doi.org/10.1117/12.271255
Autor:
F. P. Logue, Akira Ishibashi, S. J. Hewlett, Eithne M. McCabe, Tomonori Hino, K. Nakano, S. Taniguchi, John Hegarty, Jon Heffernan, C. Jordan, Paul Rees, John F. Donegan, D. T. Fewer
PUBLISHED
We describe a straightforward technique for the measurement of carrier diffusion in semiconductors. Using an optical microscope we can spatially image luminescence with a resolution of ~ 500 nm. We measured the ambipolar diffusion leng
We describe a straightforward technique for the measurement of carrier diffusion in semiconductors. Using an optical microscope we can spatially image luminescence with a resolution of ~ 500 nm. We measured the ambipolar diffusion leng
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f01bcefb4119437b764393d58d494eca
Publikováno v:
SPIE Proceedings.
We develop a theory for brightfield direct-view microscopy using finite-sized, multiple pinhole arrays in the source and detector planes. We show that the array geometry can be decoupled mathematically from the remainder of the optical system. In par
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d08e982d6c7b582c1d1a71fb2b120bf9
https://doi.org/10.1117/12.237466
https://doi.org/10.1117/12.237466
Publikováno v:
Journal of the Optical Society of America A. 14:1066
We discuss the imaging properties of the bright-field direct-view microscope employing source and detector arrays with an arbitrary distribution of pinholes. In general, we show that coherent laser illumination will result in a significant degradatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80679f26266e6321c31bef7ec687e1a5
https://doi.org/10.1364/josaa.14.001066
https://doi.org/10.1364/josaa.14.001066
Publikováno v:
ResearcherID
Scopus-Elsevier
Scopus-Elsevier
Summary Direct-view microscopes use multiple-aperture arrays in the source and detector planes. We develop a theory for brightfleld and fluorescence direct-view microscopy which allows us to determine the optical sectioning strength for finite-sized,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3eb5c04af545ac7f33cf19890d7742b4
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:A1996VV50000004&KeyUID=WOS:A1996VV50000004
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:A1996VV50000004&KeyUID=WOS:A1996VV50000004