Zobrazeno 1 - 10
of 140
pro vyhledávání: '"D. Seitzer"'
Autor:
D. Seitzer, S. Feng
Publikováno v:
IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications. 42:362-365
This brief presents characterization and design considerations of high-speed and high-precision GaAs latched comparators consisting of source coupled FET logic (SCFL) flip flops. In order to characterize the comparators, linearized equivalent circuit
Autor:
Shen Feng, D. Seitzer
Publikováno v:
IEEE Journal of Solid-State Circuits. 29:844-850
This paper presents design consideration and experimental comparison of GaAs HEMT analog switches for high-speed and high-precision sampled-data applications. At first, basic pass-transistor switches fabricated in a 0.5-/spl mu/m GaAs HEMT technology
Publikováno v:
Microelectronic Engineering. 24:155-162
A reliable approach for layout-based fine-positioning of an electron beam is presented. Precise fine positioning can be achieved using mispositioning factors derived from layout data in a given window. Consecutive layout window adjustment leads to an
Publikováno v:
Analog Integrated Circuits and Signal Processing. 4:7-20
To improve the performance of sensors it is necessary to shrink their physical dimensions. Small sensors can be realized by means of thin-film processes and microlithography. But small sensor dimension implies small output signals. If silicon is used
Publikováno v:
IEEE Journal of Solid-State Circuits. 27:1313-1320
To enhance the dynamic accuracy of high-speed A/D conversion, a 5-b flash converter with on-chip track and hold circuitry (T&H) was developed. The design is based on TriQuint's commercial 1 mu m GaAs E/D MESFET process. Dynamic characterization was p
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 41:829-833
Publikováno v:
Solid-State Electronics. 34:429-436
The method of 2D device modeling with the finite-difference method is extended to three dimensions. The theory and the development of the simulation program for that purpose are described. After calculating the potential distribution in the entire vo
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