Zobrazeno 1 - 10
of 129
pro vyhledávání: '"D. R. Spiegel"'
Publikováno v:
The Journal of Chemical Physics. 104:4920-4926
We propose a new method for analysis of nonmonotonic forced Rayleigh scattering (FRS) decay profiles. It is shown that the curvature near the local maximum of a decay–grow–decay profile or a grow–decay profile can be used to determine directly
Autor:
R. J. Helmer, D. R. Spiegel
Publikováno v:
American Journal of Physics. 63:554-560
We report the design and performance of a simple apparatus for measurement of shot‐noise fluctuations in the current from a vacuum photodiode illuminated with a pilot‐lamp light bulb. After calibrating the frequency‐dependent gain of the measur
Autor:
Andrew M. Davis, Roy S. Lewis, Robert N. Clayton, Dieter M. Gruen, Wallis F. Calaway, G. A. Curlee, Michael J. Pellin, D. R. Spiegel
Publikováno v:
Analytical Chemistry. 66:2647-2655
As preparation for analyses of minor amounts of Zr in refractory carbide interstellar grains, we have detected zirconium atoms sputtered from Zr metal and a ZrC powder, using both 1 + 1 and three-color RIMS. The two spectroscopic schemes were quantit
Autor:
Rastegar, Maryam1, Nazar, Eisa2, Nasehi, Mahshid3,4, Sharafi, Saeed3, Fakoor, Vahid5 fakoor@um.ac.ir, Shakeri, Mohammad Taghi1,6 ShakeriMT@mums.ac.ir
Publikováno v:
Infectious Disease Modelling (2468-2152). Sep2024, Vol. 9 Issue 3, p963-974. 12p.
Autor:
J. W. Burnett, Dieter M. Gruen, D. R. Spiegel, Andrew M. Davis, Michael J. Pellin, C.E. Young, Robert N. Clayton, Wallis F. Calaway, S.R. Coon
Publikováno v:
Analytical Chemistry. 64:469-475
Three-color resonance Ionization mass spectrometry (RIMS) measurements of sputtered Ti have been carried out on several oxides containing both Ti and (isobarically interfering) Ca in order to evaluate microbeam RIMS as a tool for isotopic analyses of
Autor:
Michael J. Pellin, D. R. Spiegel, Andrew M. Davis, Wallis F. Calaway, D.M. Gruen, C.E. Young, Robert N. Clayton, Joel D. Blum
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 58:505-511
Resonance ionization of sputtered species has emerged as an exceedingly powerful technique for surface-compositional analysis and as a means to study a variety of fundamental aspects of the sputtering process. To deal with the problem of non- or near
Publikováno v:
AIP Conference Proceedings.
Identification, measurements of low levels of metallic impurities on Si wafers are difficult due to rapidly changing chemical activity near the surface. Air-exposed Si surfaces typically possess a native oxide layer several atoms thick plus a top mon
Autor:
D. R. Spiegel, G. Alexander
Publikováno v:
Journal of Neuropsychiatry. 23:E24-E24
Autor:
Peter Wurz, D. R. Spiegel, Dieter M. Gruen, Wallis F. Calaway, Robert N. Clayton, Keith R. Lykke, Andrew M. Davis, C.E. Young, Michael J. Pellin
Publikováno v:
Laser Ablation Mechanisms and Applications ISBN: 9780387977317
Surface Analysis by Resonant Ionization of Sputtered Atoms (SARISA) has demonstrated the ability to detect trace elements at concentrations below 100 ppt. Use of energetic primary ions to desorb surface species is uniquely suited for elemental surfac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd0442e4cd06f65540a90c6820709d97
https://doi.org/10.1007/bfb0048353
https://doi.org/10.1007/bfb0048353
Autor:
J. W. Burnett, Wallis F. Calaway, D.M. Gruen, Michael J. Pellin, D. R. Spiegel, S.R. Coon, J. M. White
Publikováno v:
Surface Science Letters. 259:A632
Neutral copper clusters up to Cu 15 were observed from the sputtering of polycrystalline copper by normally incident 3.6 keV Ar + . This is the first observation of sputtered neutral clusters larger than Cu 5 . The sputtered neutral species were dete