Výsledky vyhledávání - "D. Pailharey"

Toward sub-micro-XRF working at nanometer range using capillary optics

Autor: A. Bjeoumikhov, S. Bjeoumikhova, R. Gubzhokov, Carole Fauquet, Brahim Dahmani, Alexei Erko, M. Dehlinger, Ivo Zizak, S. Ferrero, D. Pailharey, D. Tonneau, F. Jandard

Publikováno v: X-Ray Spectrometry. 42:456-461

Capillary optics are used for X-ray fluorescence micro-analysis using the Cu Kα line provided by a rotating anode. The excitation beam is focused using a polycapillary lens on a Co–Ti sample. Cylindrical glass capillaries of various diameters are

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::787ca187a215b078423d88bfcd12ef06
https://doi.org/10.1002/xrs.2503

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High load AFM friction and wear experiments on V2O5 thin films

Autor: T. Suszko, D. Pailharey, W. Gulbiński

Publikováno v: Wear. 254:988-993

High load friction and wear experiments by means of atomic force microscopy were carried out at the surface of highly (0 0 1) oriented vanadium oxide V 2 O 5 thin films deposited on silicon by reactive magnetron sputtering. Microscopic friction coeff

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::fa697e47e65d57850f260fb8602480dd
https://doi.org/10.1016/s0043-1648(03)00304-1

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Study of the influence of adsorbed water on AFM friction measurements on molybdenum trioxide thin films

Autor: T. Suszko, Y. Mathey, D. Pailharey, W. Gulbiński

Publikováno v: Surface Science. 475:149-158

Thin films of layered oxide α-MoO3 have been prepared by reactive magnetron sputtering. On these films we have measured friction forces and adhesive forces at the microscopic scale with an AFM, under ambient and humidity controlled conditions. We sh

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6fba18322eeba89251406ed59e58252f
https://doi.org/10.1016/s0039-6028(00)01101-8

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Friction force studies on layered materials using an Atomic Force Microscope

Autor: D. Pailharey, Hubert Klein, Y. Mathey

Publikováno v: Surface Science
Surface Science, Elsevier, 1997, 387 (1-3), pp.227-235. ⟨10.1016/S0039-6028(97)00358-0⟩
ResearcherID
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 1997, 387 (1-3), pp.227-235. ⟨10.1016/S0039-6028(97)00358-0⟩

International audience; We have studied friction force versus normal load on the nanometer scale on three layered materials which are expected to exhibit different mechanical properties: 2H-MoS2, 2H-NbS%, ~-MoO3. Different behaviours have been observ

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::52a74afafc00b53be88945e45df7ea5f
https://doi.org/10.1016/s0039-6028(97)00358-0

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Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy

Autor: A. Bjeoumikhov, Carole Fauquet, Ivo Zizak, Alexei Erko, C. Dorczynski, S. Bjeoumikhova, S. Ferrero, D. Pailharey, D. Tonneau, R. Gubzhokov, F. Jandard, M. Dehlinger, Brahim Dahmani

Publikováno v: International Journal of Nanotechnology
International Journal of Nanotechnology, 2012, 9 (3-7), pp.460-470. ⟨10.1504/IJNT.2012.045348⟩
International Journal of Nanotechnology, Inderscience, 2012, 9 (3-7), pp.460-470. ⟨10.1504/IJNT.2012.045348⟩

Marketed sources equipped with polycapillary optics allow now laboratory X–Ray Fluorescence (XRF) analysis with 5–10 µm lateral resolution. To improve it, we had the idea to use a thin cylindrical X–ray capillary fitted to the XRF detector. Th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dab5b2712dd594caf7c9ceccc884ad97
https://hal.science/hal-00697528

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Cross characterization by scanning electron microscopy and atomic force microscopy of Ag islands grown on Si (111) 7×7

Autor: M. Hanbücken, Frank Palmino, I. Vianey, D. Pailharey

Publikováno v: Microscopy Microanalysis Microstructures. 5:41-45

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::47950308dcf765ae1b49190162e07723
https://doi.org/10.1051/mmm:019940050104100

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Combining scanning probe microscopy and x-ray spectroscopy

Autor: Maël Dehlinger, R. Graziola, D. Tonneau, Sylvain Ferrero, Carole Fauquet, Aniouar Bjeoumikhov, Ivo Zizak, Franck Jandard, Juris Purans, Sylvia Larcheri, D. Pailharey, Alexei Erko, Brahim Dahmani

Publikováno v: Nanoscale Research Letters
Nanoscale Research Letters, SpringerOpen, 2011, 6, pp.308
Nanoscale Research Letters, Vol 6, Iss 1, p 308 (2011)
Nanoscale Research Letters, 2011, 6, pp.308. ⟨10.1186/1556-276X-6-308⟩

A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect lo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::891b8cf425916506083cad08120ff36b
https://doi.org/10.1186/1556-276x-6-308

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Microstructure of YBaCuO superconducting thin films deposited by high power and high repetition rate excimer lasers

Autor: M. Gerri, Bernard L. Fontaine, N. Merk, Marc Sentis, Ph. Delaporte, Yves Mathey, B. M. Forestier, D. Pailharey, Wladimir Marine

Publikováno v: Materials Science and Engineering: B. 14:134-141

The deposition parameters used for the preparatiion of thin YBaCuO films on MgO substrates by the pulsed laser ablation method are of the utmost importance in controlling the microstructure. The film quality is mainly controlled by the depos

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7ddfcde363ddf022039d43d021bd560c
https://doi.org/10.1016/0921-5107(92)90110-u

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X-ray excited optical luminescence detection by scanning near-field optical microscope : a new tool for nanoscience

Autor: R. Graziola, Silvia Larcheri, Alexei Kuzmin, D. Pailharey, Francesco Rocca, Juris Purans, Frank Jandard

Publikováno v: Review of Scientific Instruments
Review of Scientific Instruments, American Institute of Physics, 2008, 79 (1), pp.013702
Review of Scientific Instruments, 2008, 79 (1), pp.013702
Review of scientific instruments 79 (2008): 013702–1-9.
info:cnr-pdr/source/autori:S. Larcheri, F. Rocca, F. Jandard, D. Pailharey, R. Graziola,A. Kuzmin and J. Purans/titolo:X-ray Excited Optical Luminescence Detection by Scanning Near-field Optical Microscope: a new tool for nanoscience/doi:/rivista:Review of scientific instruments/anno:2008/pagina_da:013702/pagina_a:1-9/intervallo_pagine:013702–1-9/volume:79

Investigations of complex nanostructured materials used in modern technologies require special experimental techniques able to provide information on the structure and electronic properties of materials with a spatial resolution down to the nanometer

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8e73ce7741affcedb7f2a4cb6bc1dec8
https://hal.archives-ouvertes.fr/hal-00269961

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The structure of ZnWO4/ZnO films probed by XEOL-SNOM technique

Autor: F. Rocca, S. Larcheri, A. Kuzmin, R. Kalendarev, J. Purans, R. Graziola, G.Dalba, F. Jandard, D. Pailharey

Publikováno v: SILS 2008-XVI Convegno della Società Italiana di Luce di Sincrotrone, Palermo (Italy), 2008
info:cnr-pdr/source/autori:F. Rocca, S. Larcheri, A. Kuzmin, R. Kalendarev, J. Purans, R. Graziola, G.Dalba, F. Jandard, D. Pailharey/congresso_nome:SILS 2008-XVI Convegno della Società Italiana di Luce di Sincrotrone/congresso_luogo:Palermo (Italy)/congresso_data:2008/anno:2008/pagina_da:/pagina_a:/intervallo_pagine

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=cnr_________::d58e0c27f825753d642bbeeec57bf9d7
http://www.cnr.it/prodotto/i/81708

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