Zobrazeno 1 - 10
of 89
pro vyhledávání: '"D. M. GRUEN"'
Autor:
John A. Carlisle, John N. Hryn, Jeffrey W. Elam, D. M. Gruen, A. M. Kovalchenko, Ali Erdemir, Joseph A. Libera, Orlando Auciello, Michael J. Pellin
Publikováno v:
Wear. 270:325-331
The reliability and performance of silicon carbide (SiC) shaft seals on multipurpose mechanical pumps are improved by applying a protective coating of ultrananocrystalline diamond (UNCD). UNCD exhibits extreme hardness (97 GPa), low friction (0.1 in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::053142088952ae10893e17b69385ae55
https://doi.org/10.1016/j.wear.2010.10.059
https://doi.org/10.1016/j.wear.2010.10.059
Autor:
A.I. Rukovishnikov, Sergej M. Pimenov, V.I. Polyakov, V.G. Pereverzev, D. M. Gruen, E.N. Loubnin, John A. Carlisle, N.M. Rossukanyi
Publikováno v:
Diamond and Related Materials. 12:1776-1782
A comparative study of electrically active defects has been performed for undoped and nitrogen-doped nanocrystalline diamond thin films deposited on Si substrates from CH 4 /Ar/H 2 and CH 4 /Ar/N 2 gas mixtures using microwave and d.c. plasma CVD tec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b20b5b0eba9323ee3a47fd91c9370a3
https://doi.org/10.1016/s0925-9635(03)00203-6
https://doi.org/10.1016/s0925-9635(03)00203-6
Publikováno v:
Journal of Applied Physics. 90:118-122
Ultrananocrystalline diamond (UNCD) films, grown using microwave plasma-enhanced chemical vapor deposition with gas mixtures of Ar–1%CH4 or Ar–1%CH4–5%H2, have been examined with transmission electron microscopy (TEM). The films consist of equi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79798722badfb96d93916651d0e5cfae
https://doi.org/10.1063/1.1377301
https://doi.org/10.1063/1.1377301
Autor:
R. Ramesh, A. M. Dhote, Alan R. Krauss, Orlando Auciello, Eugene A. Irene, D. M. Gruen, Y. Gao, A. H. Muller, S. Aggarwal, J. Im
Publikováno v:
Integrated Ferroelectrics. 27:103-118
The science and technology of ferroelectric thin films has experienced an explosive development during the last ten years. Low-density non-volatile ferroelectric random access memories (NVFRAMs) are now incorporated in commercial products such as “
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::533db2bc2c25a4c3150dc2b354ff5748
https://doi.org/10.1080/10584589908228460
https://doi.org/10.1080/10584589908228460
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 17:2634-2641
We have modeled, designed, built, and tested a novel reflectron time-of-flight (TOF) analyzer, which is capable of performing surface analysis using both secondary ion mass spectroscopy (SIMS) and mass spectroscopy of recoiled ions (MSRI). All elemen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0cd1da90a2ee621f0ee988b98ea8d757
https://doi.org/10.1116/1.581923
https://doi.org/10.1116/1.581923
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 16:1779-1784
We have used the ion spectroscopic techniques of direct recoil spectroscopy and mass spectroscopy of recoiled ions to demonstrate that low energy reactive ion sputtering of Ge is capable of removing surface impurities such as carbon. The experiments
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5271f0de39350d6d799bad434849e7e9
https://doi.org/10.1116/1.581106
https://doi.org/10.1116/1.581106
Publikováno v:
Integrated Ferroelectrics. 22:223-235
The thermodynamic stability of Pt/Ti/SiO2/Si, Pt/TiO2/SiO2/Si, Pt/Ta/SiO2/Si, Ir/SiO2/Si, and RuO2/SiO2/Si electrode layers has been studied using mass spectroscopy of recoiled ions (MSRI), a new technique which provides monolayer-specific in situ su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49812f4c203a8004baea9502782aee2d
https://doi.org/10.1080/10584589808208044
https://doi.org/10.1080/10584589808208044
Publikováno v:
Journal of Applied Physics. 82:4051-4054
Cold cathode electron field emission from aragonite CaCO3 whiskers coated with 10-nm-thick gold has been observed. The microstructure of the whiskers grown on a Ni substrate by electrochemical deposition has been examined by scanning electron microsc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49ea520b3078ad5f8001013c3217e01d
https://doi.org/10.1063/1.365714
https://doi.org/10.1063/1.365714
Autor:
Alan R. Krauss, Vitali I. Konov, D. M. Gruen, Sergej M. Pimenov, George R. Fenske, Michael Halter, Ali Erdemir
Publikováno v:
Surface and Coatings Technology. :537-542
In this study, we explored and compared the friction and wear performance of smooth (30 nm, root mean square) and nanocrystalline diamond films (average grain size ≈ 15 nm) grown in an Ar-C60 microwave, plasma with the friction and wear performance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f23b8a454c42fe79dfab9fcd94a34879
https://doi.org/10.1016/s0257-8972(97)00496-9
https://doi.org/10.1016/s0257-8972(97)00496-9
Autor:
S. J. Wozniak, D. N. Glew, T. Thalhammer, R. Aureille, E. M. Speirs, P. Le Goff, D. E. Elliott, C.-H. A. Kruissink, T. R. Schneider, E. Hanne, J. A. Knobbout, I. Fells, J. K. Royle, J. Schroeder, H. W. Hoffman, W. Murgatroyd, H. Hörster, J. L. Peube, D. R. Glenn, J. Koefoed, F. Scholz, J. B. Siviour, G. Schöll, C. F. Meyer, T. D. Brumleve, W. R. Laws, B. Bourgeois, P. A. Lowe, H. Sandner, E. I. Austin, R. T. Tamblyn, G. B. Delancey, T. Stephens, D. Golibersuch, N. Kurti, D. G. Stephenson, G. Beckmann, J. E. I. Wilson, I. Glendenning, T. Grjebine, J. W. Hodgins, E. R. G. Eckert, R. K. Swartman, K. Hannes, J. Pauls, A. Bricard, D. M. Gruen, G. F. Hewitt, F. C. Hooper, J. Pouget, M. F. Barabas, J. Bonnin, G. A. Lane, C. W. J. Van Koppen, M. Telkes, E. G. Kovach, B. Qvale, R. F. S. Robertson, L. Barbouteau, A. C. Gringarten
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::619a126e02dbc7860f1479da594183aa
https://doi.org/10.1016/b978-0-08-021724-6.50004-9
https://doi.org/10.1016/b978-0-08-021724-6.50004-9
