Zobrazeno 1 - 10
of 72
pro vyhledávání: '"D. L. Sullivan"'
Autor:
Maxim Litvak, S. Nowicki, Lucy M. Thompson, William Rapin, Robert T. Downs, Cherie N. Achilles, Craig Hardgrove, D. L. Sullivan, I. G. Mitrofanov, Travis Gabriel, E. B. Rampe, S. Czarnecki
We report the water abundance of Bagnold Dune sand in Gale crater, Mars by analyzing active neutron experiments using the Dynamic Albedo of Neutrons instrument. We report a bulk water‐equivalent‐hydrogen abundance of 0.68 ± 0.15 wt%, which is si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e381b9cf3b28102b023473272f678d42
https://resolver.caltech.edu/CaltechAUTHORS:20190109-151441597
https://resolver.caltech.edu/CaltechAUTHORS:20190109-151441597
Publikováno v:
Journal of Environmental Quality. 20:119-123
The potential for movement of sewage sludge-borne trace metals beyond the zone of soil incorporation poses a real concern for society. To address this concern, we sampled an Aeric Ochraqualf (Blount Series) after 14 yr of massive, sludge additions (7
Publikováno v:
Obstetrics and gynecology. 83(1)
To determine closure time, pain experienced during closure, and healing time in patients undergoing deep en bloc closure or superficial skin closure of extrafascial would dehiscence.Patients with extrafascial wound dehiscence on the obstetrics and gy
Autor:
D L, Sullivan, J C, Schommer
Publikováno v:
Clinical therapeutics. 15(6)
The purpose of this study was to investigate empirically the potential cost savings to a pharmaceutical wholesaler using the Economic Order Quantity (EOQ) model. This model allows for calculating the order quantity that minimizes both ordering and ho
Autor:
W. H. Lee, D. C. Leiner, R. H. Webb, P. Baumeister, V. Amirkhanian, W. J. Walecki, B. Shen, S. F. Jacobs, S. Daniels, D. C. Rich, Ralph F. Wuerker, M. J. Simpson, E. Loewen, W. Stevenson, J. A. Decker, G. E. Cohn, B. R. Masters, A. Brunsting, H. Miranda, D. L. Sullivan, R. L. Hilliard, G. L. Mitchell
Publikováno v:
Applied Optics. 38:6977
Autor:
D. C. Rich, Ralph F. Wuerker, M. J. Simpson, W. H. Lee, E. Loewen, W. J. Walecki, J. A. Decker, R. H. Webb, S. F. Jacobs, S. Daniels, P. Baumeister, M. Amirkhanian, R. L. Hilliard, A. Brunsting, G. L. Mitchell, H. Miranda, D. L. Sullivan, B. Shen, W. Stevenson, G. E. Cohn, B. R. Masters, D. C. Leiner
Publikováno v:
Applied Optics. 38:6465
Autor:
E. Loewen, W. H. Lee, D. L. Sullivan, B. Shen, G. L. Mitchell, A. Brunsting, G. E. Cohn, W. J. Walecki, M. J. Simpson, M. Amirkhanian, W. Stevenson, R. H. Webb, H. Miranda, R. F. Wuerker, P. Baumeister, S. Daniels, S. F. Jacobs, B. R. Masters, R. L. Hilliard, D. C. Rich, D. C. Leiner, J. A. Decker
Publikováno v:
Applied Optics. 38:5911
Autor:
W. H. Lee, G. E. Cohn, D. C. Leiner, B. R. Masters, S. F. Jacobs, S. Daniels, D. C. Rich, E. Loewen, W. J. Walecki, W. Stevenson, J. A. Decker, H. Miranda, R. H. Webb, G. L. Mitchell, P. Baumeister, R. L. Hilliard, D. L. Sullivan, B. Shen, A. Brunsting, Ralph F. Wuerker, M. J. Simpson, M. Amirkhanian
Publikováno v:
Applied Optics. 38:5264
The patent number, date of issuance by the U.S. Patent Office, and classification are shown on the first line. The filing date is that of the first application (although some patents may derive from earlier applications with earlier claim dates). Any
Autor:
R. D. Rallison, D. C. Leiner, S. D. Miles, W. H. Lee, P. M. Kuhn, R. F. Wuerker, S. F. Jacobs, B. Shen, H. Miranda, R. H. Webb, W. Stevenson, N. Kaiser, R. L. Hilliard, A. Mann, G. L. Mitchell, D. Fisher, M. Amirkhanian, P. Baumeister, D. C. Rich, M. J. Simpson, J. A. Decker, B. R. Masters, A. Brunsting, D. C. Gilkeson, S. Daniels, W. J. Walecki, I. J. Abramovitz, D. E. Williamson, D. L. Sullivan, E. Loewen
Publikováno v:
Applied Optics. 38:3440
Autor:
D. C. Gilkeson, G. L. Mitchell, D. Fisher, D. C. Leiner, R. F. Wuerker, R. L. Hilliard, M. J. Simpson, I. J. Abramovitz, P. M. Kuhn, B. R. Masters, A. Brunsting, W. Stevenson, D. L. Sullivan, M. Amirkhanian, W. H. Lee, D. C. Rich, A. Mann, J. A. Decker, S. F. Jacobs, E. Loewen, R. D. Rallison, H. Miranda, S. D. Miles, D. E. Williamson
Publikováno v:
Applied Optics. 38:1073