Zobrazeno 1 - 10
of 94
pro vyhledávání: '"D. Lübbert"'
Autor:
D. Lübbert, Tilo Baumbach, Lukas Helfen, T. dos Santos Rolo, Feng Xu, Patrik Vagovic, Danielle Pelliccia, Alexey Ershov, Peter Modregger
Publikováno v:
Materials Testing. 51:642-651
Kurzfassung Mikrotomographie erlaubt die hochauflösende Abbildung verdeckter Mikrostrukturen und den Nachweis von Mikrorissen und Mikroporen in vielfältigen Bereichen, darunter die Untersuchung von mikroporösen Materialien und Fasernetzwerken, der
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46c54ce948875395aa0f22f9bfd6ad1b
https://doi.org/10.3139/120.110081
https://doi.org/10.3139/120.110081
Publikováno v:
Crystal Research and Technology. 44:534-538
Spatially resolved rocking curve imaging has been used to analyze laterally overgrown silicon layers grown by liquid phase epitaxy. We were able to study both the overgrown layer as well as the strain fluctuations of the Si substrate underneath by me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e42660e66f7c93e93e104ce4c66241e
https://doi.org/10.1002/crat.200900115
https://doi.org/10.1002/crat.200900115
Publikováno v:
physica status solidi (a). 204:2746-2752
The spatial resolution of an imaging system is most often experimentally determined by using model objects and idealized imaging conditions. This traditional approach does not properly take into account the influence of noise and the dependence of co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ca36261de31e282c5de54c4e844d86b
https://doi.org/10.1002/pssa.200675685
https://doi.org/10.1002/pssa.200675685
Publikováno v:
physica status solidi (a). 204:2509-2513
The XTOP conference, held every other year at a different location in Europe, is one of the central scientific platforms for methods and instrumentation in synchrotron-based high resolution X-ray diffraction methods, phase contrast imaging and microt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7af4a581ad1df76201df818ea6a1f534
https://doi.org/10.1002/pssa.200790014
https://doi.org/10.1002/pssa.200790014
Autor:
J. Arthur, D. Lübbert, I. Kegel, Michael Sztucki, T. H. Metzger, J. R. Patel, A. Tilke, Jean-Luc Rouvière
Publikováno v:
Journal of Applied Physics. 92:3694-3703
We demonstrate the application of surface sensitive diffuse x-ray scattering under the condition of grazing incidence and exit angles to investigate growth and dissolution of near-surface defects after boron implantation in silicon(001) and annealing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10935fc17cf5d33257043586307f9990
https://doi.org/10.1063/1.1505982
https://doi.org/10.1063/1.1505982
Publikováno v:
Journal of Applied Physics. 87:3744-3758
The surface shape and the spatial distribution of strain in GaInAs/InP multilayer gratings is experimentally determined by combining high-resolution x-ray diffraction and grazing-incidence diffraction. Dramatic deformations of the diffraction pattern
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::360aa36bb4301bf704f5298223f72112
https://doi.org/10.1063/1.372409
https://doi.org/10.1063/1.372409
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 160:521-527
We present a method and an equipment for performing μm-resolved X-ray diffraction area maps, and apply it to wafer defect analysis and industrial wafer quality inspection. The method determines simultaneously the macroscopic warpage, the mesoscopic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7dbfd7e62c213f673963e624d60db6d1
https://doi.org/10.1016/s0168-583x(99)00619-9
https://doi.org/10.1016/s0168-583x(99)00619-9
Publikováno v:
Materials Science and Engineering: B. :392-396
We study the lattice strain relaxation in pseudomorphic surface gratings using high resolution X-ray diffraction (XRD), grazing incidence diffraction and elasticity theory. By means of grazing incidence diffraction we determine the grating shape and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::588ae74106e031e5e662579e05a978d2
https://doi.org/10.1016/s0921-5107(99)00415-8
https://doi.org/10.1016/s0921-5107(99)00415-8
Publikováno v:
Acta Physica Polonica A. 116:976-978
X-ray rocking curve imaging technique was used to study crystallographic perfection of laterally overgrown epitaxial structures. We focus on rocking curve imaging studies of Si-doped GaAs and GaSb laterally overgrown layers grown by liquid phase epit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97a19fd1929c7dc9b6e9876663398fab
https://doi.org/10.12693/aphyspola.116.976
https://doi.org/10.12693/aphyspola.116.976
Publikováno v:
Europhysics Letters (EPL). 46:479-485
We investigate the strain evolution in low strained gratings before and after embedding in the substrate material by high-resolution grazing incidence X-ray diffraction and elasticity theory. For the experiments, we use a non-coplanar multiple crysta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01d6c8ae511b16b729005640e16c0ca5
https://doi.org/10.1209/epl/i1999-00288-6
https://doi.org/10.1209/epl/i1999-00288-6