Zobrazeno 1 - 10
of 33
pro vyhledávání: '"D. Kunstelj"'
Publikováno v:
Scopus-Elsevier
Modulations and pairing of Bi atoms in the Bi 2 Sr 2 CaCu 2 O 8+x high-temperature superconductor are simultaneously observed on the high-resolution electron micrographs, viewed along the [101] crystal direction. We analyze the obtained images by las
Publikováno v:
Philosophical Magazine. 34:67-77
Structural and microhardness changes in an A1-0-26 at.-% Sn alloy quenched from the melt and annealed are presented. The experiments show that solid solution of 0-26 at.-% tin in aluminium, as seen in an electron microscope, can be obtained by means
Publikováno v:
Journal of Materials Science. 10:243-251
A study was made of the intensity of scattering of monochromatic X-rays at small angles from Al-3.6 at. % Ni and Al-0.26 at. % Sn solid solutions, in order to determine if the solutes are really dispersed. Electron-microscopic examinations were also
Publikováno v:
Thin Solid Films. 36:475-478
Publikováno v:
Journal of Applied Crystallography. 17:307-314
The many-beam dynamical theory of moiré fringes of Gevers [Phys. Status Solidi (1963). 3, 2289–2297] has been applied to the parallel moiré case and the results have been verified on epitaxically grown Sn/SnTe specimens showing the sensitivity of
Publikováno v:
Physica Status Solidi (a). 68:363-372
Moire patterns in electron micrographs of disk-like η-phase precipitates in Al-Ni and Al-Ni-Sn alloys, and of epitaxially grown SnTe-Sn-SnTe thin films are presented. Comparison is made with the theoretical fringe profiles computed on the basis of t
Publikováno v:
Physica Status Solidi (a). 67:543-554
The known theory of moire fringes, based on the two-beam dynamical theory of electron diffraction, is applied to the parallel moire effect produced by three-layer crystals, the middle layer being of different crystal material (crystal sandwiches). Th
Publikováno v:
Journal of Materials Science. 17:2771-2780
Stacking faults, which were detected in the Ag-In system, have been examined by transmission electron microscopy and electron diffraction. An enhanced concentration of stacking faults in splat cooled specimens as well as the formation of a metastable
Publikováno v:
Journal of Crystal Growth. 76:476-484
The peculiar electron diffraction patterns of Sn/SnTe specimens grown by evaporation on a NaCl substrate were studied. The streaks formed by doubly diffracted beams could be explained by simple rotations of the lattices. It is shown that the pattern
Publikováno v:
Scripta Metallurgica. 7:883-886