Zobrazeno 1 - 2
of 2
pro vyhledávání: '"D. Kho Ching Tien"'
Autor:
Koo Sang Sool, D. Kho Ching Tien
Publikováno v:
2008 IEEE International Conference on Semiconductor Electronics.
The work presented here shows a change in migration behaviour of a transferred AlCu metallization system. Different failure mechanisms in metallization are known. Migration effects like electro-, thermo- and stress migration are the main failure mech
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2631ae9ebce62bf2bd3fcb9c1be4fe16
https://doi.org/10.1109/smelec.2008.4770354
https://doi.org/10.1109/smelec.2008.4770354
Publikováno v:
2008 IEEE International Conference on Semiconductor Electronics.
The work presented here shows a series of engineering runs to improve the AC HCI lifetime for a 0.60 mum NMOS. The conventional method of increasing NLDD energy and reducing NLDD dose did not achieve significant improvement. The study concludes that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ddbe9e5291e91340229b5b2edc8404c5
https://doi.org/10.1109/smelec.2008.4770362
https://doi.org/10.1109/smelec.2008.4770362