Zobrazeno 1 - 10
of 29
pro vyhledávání: '"D. K. Kabilov"'
Publikováno v:
Semiconductor Science and Technology. 14:1012-1017
Photoelectric properties of (HMS)-SiMn-M structures, where HMS is higher manganese silicide formed in diffusion doping of silicon with manganese and M is metal contact, have been studied in a wide range of temperatures and light wavelengths. After il
Autor:
R. A. Muminov, Kh. Kh. Khusnutdinova, I.S. Samiev, V. V. Klechkovskaya, T. S. Kamilov, D. K. Kabilov
Publikováno v:
Technical Physics. 50:1102-1104
The formation of higher manganese silicide (HMS) films on silicon and the properties of the silicide-silicon interface are studied. Morphology analysis of the surface and thin transition layer at the HMS-Si interface suggests that the growth of HMS f
Publikováno v:
Proceedings ICT'03. 22nd International Conference on Thermoelectrics (IEEE Cat. No.03TH8726).
The analysis of possibilities of producing the thin-film thermoelectric radiation detector was carried out. It is shown that use of the higher manganese silicide (HMS) films, which formed directly on silicon substrate, allows to avoid the row constri
Autor:
I.S. Zanaveskina, V. V. Klechkovskaya, D. K. Kabilov, A.A. Uzokov, T. S. Kamilov, S.V. Ordin, B. N. Zaveryukhin, R. A. Muminov
Publikováno v:
Proceedings ICT'03. 22nd International Conference on Thermoelectrics (IEEE Cat. No.03TH8726).
It is known that HMS - MnSi/sub 1.71-1.75/ is an anisotropy degenerative semiconductor and has figure-of-merit Z=0.7x10/sup -3/ K/sup -1/ in the range T=400-1000K. It is used in production of high effective thermoelectric converters. Besides, HMS has
Autor:
Orekhov, A. S.1, Kamilov, T. S.2, Gaibov, A. G.2, Vakhabov, K. I.2, Klechkovskaya, V. V.1 klechvv@ns.crys.ras.ru
Publikováno v:
Technical Physics. Jun2010, Vol. 55 Issue 6, p874-876. 3p. 2 Black and White Photographs, 1 Chart.
Publikováno v:
Japanese Journal of Applied Physics; 5/5/2023, Vol. 62 Issue SD, p1-9, 9p
Publikováno v:
Semiconductors. Oct2015, Vol. 49 Issue 10, p1281-1284. 4p.
Publikováno v:
Technical Physics. Dec2014, Vol. 59 Issue 12, p1833-1838. 6p.
Autor:
Kamilov, T.1 tulkyn@mail.ru, Klechkovskaya, V.2 klechvv@ns.crys.ras.ru, Sharipov, B.1, Turaev, A.1
Publikováno v:
Technical Physics. Aug2013, Vol. 58 Issue 8, p1182-1188. 7p. 4 Graphs.
Publikováno v:
Technical Physics. Jun2013, Vol. 58 Issue 6, p902-906. 5p. 3 Graphs.