Zobrazeno 1 - 10
of 12
pro vyhledávání: '"D. I. Devyaterikov"'
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 16:1106-1110
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 16:839-842
Autor:
Vladimir I. Zverev, V. D. Zhaketov, V. V. Ustinov, Yu. V. Nikitenko, E. M. Pashaev, O. A. Kondrat’ev, E. A. Kravtsov, D. I. Devyaterikov, V. V. Proglyado, I. A. Subbotin
Publikováno v:
Physics of Metals and Metallography. 122:465-471
Abstract The role of size effects in the formation of the magnetic structure of Dy and Ho thin films in absence of epitaxial strain is studied in this work. It was found that, for Dy in the temperature range between the Néel temperature and the Curi
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15:542-548
In this paper, the results of investigating thin films of rare-earth helimagnetics (REMs) Dy and Ho by polarized neutron reflectometry are presented. It is shown that the growth by magnetron sputtering of rare-earth structures on sapphire substrates
Autor:
M. V. Makarova, E. A. Kravtsov, V. V. Ustinov, V. D. Zhaketov, D. I. Devyaterikov, V. V. Proglyado, E. A. Stepanova, V. O. Vas’kovsky
Publikováno v:
Physics of Metals and Metallography. 121:1127-1131
Using high-vacuum magnetron sputtering, epitaxial Dy films were synthesized on Nb and Ta buffer layers on single-crystal Al2O3 substrates with different crystallographic orientations. It was established that the epitaxial relationships [11 $$\bar {2}
Autor:
V. V. Vasin, L. N. Romashev, V. V. Ustinov, Yu. A. Babanov, D. A. Ponomarev, D. I. Devyaterikov
Publikováno v:
Physics of Metals and Metallography. 120:756-762
An experimental depth-resolved method for analyzing the local atomic structure of low-contrast multilayered thin films is presented in this work. A combination of X-ray reflectometry and angle-resolved EXAFS spectroscopy is considered. The following
Autor:
L. N. Romashev, V. V. Vasin, V. V. Ustinov, Yu. A. Babanov, D. I. Devyaterikov, D.A. Ponomarev
Publikováno v:
Thin Solid Films. 656:44-52
An experimental method for studying the local atomic structure with a depth resolution in low-contrast multilayered thin films is proposed. We consider combination of the X-ray reflectivity and the extended X-ray absorption fine structure spectroscop
Autor:
L. N. Romashev, V. V. Vasin, Yu. A. Salamatov, D.A. Ponomarev, D. I. Devyaterikov, A. L. Ageev, V. V. Ustinov, Yu. A. Babanov
Publikováno v:
Journal of Magnetism and Magnetic Materials. 440:203-206
A depth-resolved method for the investigation of the local atomic structure by combining data of X-ray reflectivity and angle-resolved EXAFS is proposed. The solution of the problem can be divided into three stages: 1) determination of the element co
Autor:
E. M. Pashaev, V. V. Ustinov, E. A. Kravtsov, Yu. V. Nikitenko, O. A. Kondrat’ev, D. I. Devyaterikov, Vladimir I. Zverev, V. D. Zhaketov, V. V. Proglyado, I. A. Subbotin
Publikováno v:
Physics of Metals and Metallography. 122:826-826
Publikováno v:
Journal of Magnetism and Magnetic Materials. 440:207-209
A new modelless method of determining the element concentration profile of metallic multilayer nanoheterostructures for low-contrast systems is applied to study periodical and aperiodical multilayer Fe/Cr system by X-ray reflectivity. As a special ca