Zobrazeno 1 - 10
of 219
pro vyhledávání: '"D. G. Purdie"'
Publikováno v:
Nature Communications, Vol 9, Iss 1, Pp 1-12 (2018)
Atomically-clean interfaces are required in heterostructures. Here, authors report a method for fast and parallel removal of contaminants from fully-formed heterostructures, including sample intentionally exposed to polymers and solvent, achieving ro
Externí odkaz:
https://doaj.org/article/c0f384b42b4e480193398d58cac1ddfe
Autor:
Lu, Meng1 (AUTHOR), Hui, Ernestine1 (AUTHOR), Brockhoff, Marius1 (AUTHOR), Träuble, Jakob1 (AUTHOR), Fernandez‐Villegas, Ana1 (AUTHOR), Burton, Oliver J2 (AUTHOR), Lamb, Jacob1 (AUTHOR), Ward, Edward1 (AUTHOR), Woodhams, Philippa J1 (AUTHOR), Tadbier, Wadood2 (AUTHOR), Läubli, Nino F1 (AUTHOR), Hofmann, Stephan2 (AUTHOR), Kaminski, Clemens F1 (AUTHOR), Lombardo, Antonio3 (AUTHOR) a.lombardo@ucl.ac.uk, Kaminski Schierle, Gabriele S1 (AUTHOR) gsk20@cam.ac.uk
Publikováno v:
Advanced Science. Nov2024, Vol. 11 Issue 44, p1-13. 13p.
Autor:
Liu, Binbin1,2 (AUTHOR), Hou, Jiagang3 (AUTHOR), Wang, Kai1,4 (AUTHOR), Xu, Caixia1 (AUTHOR) chm_xucx@ujn.edu.cn, Zhang, Qinghua5 (AUTHOR), Gu, Lin5 (AUTHOR) l.gu@iphy.ac.cn, Zhou, Weijia1 (AUTHOR), Li, Qian1 (AUTHOR), Wang, John2 (AUTHOR), Liu, Hong1,6 (AUTHOR) ifc_liuh@ujn.edu.cn
Publikováno v:
Advanced Science. 11/13/2024, Vol. 11 Issue 42, p1-12. 12p.
Autor:
Barnard, James P.1 (AUTHOR), Shen, Jianan1 (AUTHOR), Tsai, Benson Kunhung1 (AUTHOR), Zhang, Yizhi1 (AUTHOR), Chhabra, Max R.1 (AUTHOR), Xu, Ke1 (AUTHOR), Zhang, Xinghang1 (AUTHOR), Sarma, Raktim2,3 (AUTHOR), Siddiqui, Aleem4 (AUTHOR), Wang, Haiyan1,5 (AUTHOR) hwang00@purdue.edu
Publikováno v:
Small Science. Sep2024, Vol. 4 Issue 9, p1-10. 10p.
Autor:
Ghaebi, Omid1, Klimmer, Sebastian1,2, Tornow, Nele1, Buijssen, Niels1, Taniguchi, Takashi3, Watanabe, Kenji4, Tomadin, Andrea5, Rostami, Habib6, Soavi, Giancarlo1,7 giancarlo.soavi@uni-jena.de
Publikováno v:
Advanced Science. 8/21/2024, Vol. 11 Issue 31, p1-9. 9p.
Autor:
Lu H; State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China.; University of Chinese Academy of Sciences, Beijing, 100049, China., Xue H; State Key Laboratory of Surface Physics and Department of Physics, Institute for Nanoelectronic Devices and Quantum Computing, Fudan University, Shanghai, 200433, China.; Westlake Institute for Optoelectronics, Hangzhou, 310024, China., Zeng D; State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China.; University of Chinese Academy of Sciences, Beijing, 100049, China., Liu G; State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China., Zhu L; State Key Laboratory of Surface Physics and Department of Physics, Institute for Nanoelectronic Devices and Quantum Computing, Fudan University, Shanghai, 200433, China., Tian Z; State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China., Chu PK; Department of Physics, Department of Materials Science and Engineering, and Department of Biomedical Engineering, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, 999077, China., Mei Y; Department of Materials Science, Fudan University, Shanghai, 200433, China., Zhang M; State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China., An Z; State Key Laboratory of Surface Physics and Department of Physics, Institute for Nanoelectronic Devices and Quantum Computing, Fudan University, Shanghai, 200433, China., Di Z; State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Aug; Vol. 36 (32), pp. e2402679. Date of Electronic Publication: 2024 Jun 07.
Autor:
Zhu Y; Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Science, College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China.; Academy for Advanced Interdisciplinary Studies, Peking University, Beijing, 100871, P. R. China.; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China., Zhang J; Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Science, College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China.; Academy for Advanced Interdisciplinary Studies, Peking University, Beijing, 100871, P. R. China.; Cambridge Graphene Centre, University of Cambridge, Cambridge, CB3 0FA, UK., Cheng T; Department of Materials Science & NanoEngineering, Rice University, Houston, TX, 77005, USA., Tang J; Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Science, College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China., Duan H; Academy for Advanced Interdisciplinary Studies, Peking University, Beijing, 100871, P. R. China.; National Key Laboratory of Advanced Micro and Nano Manufacture Technology, School of Integrated Circuits, Peking University, Beijing, 100871, P. R. China., Hu Z; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China.; School of Materials Science and Engineering, Peking University, Beijing, 100871, P. R. China., Shao J; Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Science, College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China.; Academy for Advanced Interdisciplinary Studies, Peking University, Beijing, 100871, P. R. China.; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China., Wang S; Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Science, College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China.; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China., Wei M; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China., Wu H; School of Materials Science and Engineering, Peking University, Beijing, 100871, P. R. China., Li A; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China.; College of Science, China University of Petroleum, Beijing, 102249, P. R. China., Li S; Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Science, College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China.; Academy for Advanced Interdisciplinary Studies, Peking University, Beijing, 100871, P. R. China.; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China., Balci O; Cambridge Graphene Centre, University of Cambridge, Cambridge, CB3 0FA, UK., Shinde SM; Cambridge Graphene Centre, University of Cambridge, Cambridge, CB3 0FA, UK., Ramezani H; Cambridge Graphene Centre, University of Cambridge, Cambridge, CB3 0FA, UK., Wang L; Academy for Advanced Interdisciplinary Studies, Peking University, Beijing, 100871, P. R. China.; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China.; National Key Laboratory of Advanced Micro and Nano Manufacture Technology, School of Integrated Circuits, Peking University, Beijing, 100871, P. R. China., Lin L; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China.; School of Materials Science and Engineering, Peking University, Beijing, 100871, P. R. China., Ferrari AC; Cambridge Graphene Centre, University of Cambridge, Cambridge, CB3 0FA, UK., Yakobson BI; Department of Materials Science & NanoEngineering, Rice University, Houston, TX, 77005, USA.; Department of Chemistry, Rice University, Houston, TX, 77005, USA., Peng H; Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Science, College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China.; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China., Jia K; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China., Liu Z; Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Science, College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China.; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, Beijing Graphene Institute, Beijing, 100095, P. R. China.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Apr; Vol. 36 (17), pp. e2308802. Date of Electronic Publication: 2023 Nov 29.
Autor:
Li, Guili, Zhang, Xiaoxian, Wang, Yongsheng, Liu, XiaoJing, Ren, FangYing, He, Jiaqi, He, Dawei, Zhao, Hui
Publikováno v:
Nanoscale; 12/14/2024, Vol. 16 Issue 46, p21471-21481, 11p
Autor:
Guo, Tianjing, Argyropoulos, Christos
Publikováno v:
Journal of Applied Physics; 8/7/2023, Vol. 134 Issue 5, p1-21, 21p
Autor:
Grubišić‐Čabo, Antonija1,2 (AUTHOR) a.grubisic-cabo@rug.nl, Michiardi, Matteo3,4 (AUTHOR), Sanders, Charlotte E.5 (AUTHOR), Bianchi, Marco6 (AUTHOR), Curcio, Davide6 (AUTHOR), Phuyal, Dibya2 (AUTHOR), Berntsen, Magnus H.2 (AUTHOR), Guo, Qinda2 (AUTHOR), Dendzik, Maciej2 (AUTHOR) dendzik@kth.se
Publikováno v:
Advanced Science. 8/4/2023, Vol. 10 Issue 22, p1-9. 9p.