Zobrazeno 1 - 10
of 17
pro vyhledávání: '"D. Fulgoni"'
Publikováno v:
IEEE Photonics Journal, Vol 2, Iss 5, Pp 686-695 (2010)
Using layer transfer and wafer bonding followed by epitaxial regrowth, we design, realize, and characterize a novel generation of Germanium-on-Glass (GoG) near-infrared light sensors. In particular, we demonstrate GoG p-n junction photodetectors and
Externí odkaz:
https://doaj.org/article/9f73686fe4f94a42bb4afb694f9ac1e4
Autor:
A. De Iacovo, D. Fulgoni, M. Palmer, Gaetano Assanto, Lorenzo Colace, Vito Sorianello, L. Nash
Publikováno v:
Thin Solid Films. 518:2501-2504
We report oil novel pn Ge photodetectors fabricated oil glass The fabrication consists of wafer bonding and layer splitting. followed by a low-temperature epitaxial growth of Ge The photodiodes are characterized in terms of dark current and responsiv
Autor:
Lorenzo Colace, Vito Sorianello, M. Palmer, Gaetano Assanto, D. Fulgoni, L. Nash, Carlo Maragliano
Publikováno v:
8th IEEE International Conference on Group IV Photonics.
We report on the fabrication and characterization of Ge solar cells on glass realized by layer transfer and epitaxial regrowth. These devices exhibit typical conversion efficiency exceeding 2.4% under AM1.5 irradiation and maximum efficiency of 3.7%
We report on Germanium on Glass solar cells realized by wafer bonding, layer splitting and epitaxial regrowth. We provide a detailed description of the layer transfer process and discuss the material characterization. The solar cells are fabricated a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bfdd0e99d71541d9bbe2ca59e971f13c
https://hdl.handle.net/11590/267416
https://hdl.handle.net/11590/267416
Autor:
L. Nash, Ian Ballard, Gerard Bauhuis, E.J. Haverkamp, D. Fulgoni, Geoffrey Duggan, John J. Schermer, Peter Mulder
Publikováno v:
35th IEEE Photovoltaic Specialists Conference, Hawaiian Convention Center Honolulu, Hawaii, June 20-25, 2010. Conference Proceedings, pp. 001243-001247
35th IEEE Photovoltaic Specialists Conference, Hawaiian Convention Center Honolulu, Hawaii, June 20-25, 2010. Conference Proceedings, 001243-001247. S.l. : IEEE
STARTPAGE=001243;ENDPAGE=001247;TITLE=35th IEEE Photovoltaic Specialists Conference, Hawaiian Convention Center Honolulu, Hawaii, June 20-25, 2010. Conference Proceedings
35th IEEE Photovoltaic Specialists Conference, Hawaiian Convention Center Honolulu, Hawaii, June 20-25, 2010. Conference Proceedings, 001243-001247. S.l. : IEEE
STARTPAGE=001243;ENDPAGE=001247;TITLE=35th IEEE Photovoltaic Specialists Conference, Hawaiian Convention Center Honolulu, Hawaii, June 20-25, 2010. Conference Proceedings
Contains fulltext : 174583.pdf (Publisher’s version ) (Closed access) Contains fulltext : 174583.pdf (Author’s version preprint ) (Open Access) 35th IEEE Photovoltaic Specialists Conference, Hawaiian Convention Center Honolulu, Hawaii, June 20-25
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c52f32fd8b33a37291da6a5f66cd557f
https://hdl.handle.net/2066/174583
https://hdl.handle.net/2066/174583
Ge-on-glass photodetectors is fabricated by wafer bonding and layer splitting, followed by the epitaxial growth of pn structures. The detectors exhibit a remarkably low dark current density of 50 muA/cm 2 at 1 V reverse bias and responsivities as hig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::245928a19741353704e8f7092b5b11e1
https://hdl.handle.net/11590/149062
https://hdl.handle.net/11590/149062
We investigate and characterize p-i-n near-infrared photodiodes fabricated in Ge-on-Si by reduced-pressure chemical vapor deposition, a technology compatible with silicon processing. The detectors exhibit remarkably low dark current densities of 1mA/
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fec103a69c170eebb60d7921846c3f1a
https://hdl.handle.net/11590/120430
https://hdl.handle.net/11590/120430
We demonstrate near-infrared Ge-on-Si photodiodes designed to minimize the dark current density and fabricated by chemical vapor deposition. The p-i-n detectors exhibit record low dark currents of 7 nA at 1-V reverse bias with responsivities close to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc2f41e569a68d20db2e1af54c406ed9
https://hdl.handle.net/11590/149073
https://hdl.handle.net/11590/149073
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