Výsledky vyhledávání - "D. E. JESSON"

Akademický článek

Autor: S. M. Kennedy, C. X. Zheng, J. Fu, W. X. Tang, D. M. Paganin, D. E. Jesson

Publikováno v: AIP Advances, Vol 2, Iss 2, Pp 022152-022152-6 (2012)

A maskless method of electron beam lithography is described which uses the reflection of an electron beam from an electrostatic mirror to produce caustics in the demagnified image projected onto a resist–coated wafer. By varying the electron optics

Externí odkaz: https://doaj.org/article/174bc4ce87d1409a804c5a6431485d23

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Selected energy dark-field imaging using low energy electrons for optimal surface phase discrimination

Autor: Y R, Niu, J, Pereiro, D, Gomez, D E, Jesson

Publikováno v: Ultramicroscopy. 200

We propose a general strategy for surface phase discrimination by dark-field imaging using low energy electrons, which maximizes contrast using diffraction spots, at selected optimal energies. The method can be automated to produce composite phase ma

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::413e13dc12fefada1b4827a989e118c8
https://pubmed.ncbi.nlm.nih.gov/30836287

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WAVE OPTICAL TREATMENT OF SURFACE STEP CONTRAST IN LOW-ENERGY ELECTRON MICROSCOPY

Autor: S. M. KENNEDY, N. E. SCHOFIELD, D. M. PAGANIN, D. E. JESSON

Publikováno v: Surface Review and Letters. 16(06):855-867

A wave optical treatment of surface step contrast in a low-energy electron microscopy (LEEM) is presented. The aberrations of an idealised LEEM imaging system are directly incorporated into a transfer function (TF) and image simulations of surface st

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______645::9c08f3acf205b6c11678d850750118f5
http://www.worldscinet.com/cgi-bin/details.cgi?type=html&id=pii:S0218625X09013402

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Incoherent imaging of crystals using thermally scattered electrons

Autor: S. J. Pennycook, D. E. Jesson

Publikováno v: Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences. 449:273-293

Thermal diffuse scattering of electrons through large angles by a simple low-index crystal projection is examined in the context of a phonon model, based on the Warren approximation of X-ray diffraction. The scattering from an individual atomic colum

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f22f8e5dc6600fe1a09fae2730b8a8f9
https://doi.org/10.1098/rspa.1995.0044

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Incoherent imaging of thin specimens using coherently scattered electrons

Autor: D. E. Jesson, S. J. Pennycook

Publikováno v: Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences. 441:261-281

We consider the imaging of phase objects using a scanning transmission electron microscope equipped with a large inner-angle annular detector. We show, contrary to popular expectation, that incoherent imaging theory can be used to describe the imagin

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1474b76621e90533e8dbb2d2d78248c3
https://doi.org/10.1098/rspa.1993.0060

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An investigation of three-dimensional diffraction from 2Hb-MoS2

Autor: John W Steeds, D. E. Jesson

Publikováno v: Philosophical Magazine A. 61:363-384

Three-dimensional diffraction from the [0001] axis of 2Hb-MoS2 is examined as a special case of diffraction from zone axes which consist of projected atomic strings containing more than one atom species. In particular, a complicating effect due to mo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::476bf75c458603e434301fa276582411
https://doi.org/10.1080/01418619008231923

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Higher-order Laue zone diffraction from crystals containing transverse stacking faults

Autor: D. E. Jesson, John W Steeds

Publikováno v: Philosophical Magazine A. 61:385-415

An accessible theory of higher-order Laue zone (HOLZ) diffraction from crystals containing transverse stacking faults is presented. This is used to investigate the sensitivity of intensity profiles to displacement vector, fault depth and absorption e

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e85432d7687dd0eda595f6dc89355512
https://doi.org/10.1080/01418619008231924

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Nanoscale Science, Engineering and Technology Research Directions

Autor: D. H. Lowndes, A. P. Alivisatos, M. Alper, R. S. Averback, J. Jacob Barhen, J. A. Eastman, D. Imre, I. McNulty, T. A. Michalske, K-M Ho, A. J. Nozik, T. P. Russell, R. A. Valentin, D. O. Welch, J. Barhen, S. R. Agnew, P. Bellon, J. Blair, L. A. Boatner, Y. Braiman, J. D. Budai, G. W. Crabtree, L. C. Feldman, C. P. Flynn, D. B. Geohegan, E. P. George, E. Greenbaum, C. Grigoropoulos, T. E. Haynes, J. Heberlein, J. Hichman, O. W. Holland, S. Honda, J. A. Horton, M. Z.-C. Hu, D. E. Jesson, D. C. Joy, A. Krauss, W.-K. Kwok, B. C. Larson, D. J. Larson, K. Likharev, C. T. Liu, A. Majumdar, P. J. Maziasz, A. Meldrum, J. C. Miller, F. A. Modine, S. J. Pennycook, G. M. Pharr, S. Phillpot, D. L. Price, V. Protopopescu, D. B. Poker, D. Pui, J. M. Ramsey, N. Rao, L. Reichl, J. Roberto, M-L Saboungi, M. Simpson, S. Strieffer, T. Thundat, M. Wambsganss, J. Wendleken, C. W. White, G. Wilemski, S. P. Withrow, D. Wolf, J. H. Zhu, R. A. Zuhr, A. Zunger, S. Lowe

This report describes important future research directions in nanoscale science, engineering and technology. It was prepared in connection with an anticipated national research initiative on nanotechnology for the twenty-first century. The research d

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::daf9e67a0a727ea6cbd8994259429221
https://doi.org/10.2172/899254

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Correlating imaging and spectroscopy at atomic resolution in the STEM

Autor: A. J. Mcgibbon, N. D. Browning, S. J. Pennycook, D. E. Jesson

Publikováno v: Proceedings, annual meeting, Electron Microscopy Society of America. 53:78-79

The study of materials by electron microscopy has traditionally been divided into two sub-fields, imaging and microanalysis. While both of these have advanced to the level of atomic sensitivity, a complete characterization of a materials structure, c

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::67d1e5b46adf498e1c6fd05c4c4aca38
https://doi.org/10.1017/s0424820100136763

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Z-contrast imaging of catalysts in the 300 kV STEM

Autor: S. J. Pennycook, D. E. Jesson, D. R. Liu

Publikováno v: Proceedings, annual meeting, Electron Microscopy Society of America. 53:414-415

Z-contrast imaging in the scanning transmission electron microscope has become the accepted technique for imaging sub-nanometer catalyst clusters, utilizing the high angle annular detector introduced by Howie. The lack of coherent phase contrast effe

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::be0669a9f02ab57344d1bc02edce8a05
https://doi.org/10.1017/s0424820100138440

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