Zobrazeno 1 - 10
of 32
pro vyhledávání: '"D. E. Hardy"'
Publikováno v:
Journal of Chromatographic Science. 49:1-7
Quantitative analysis of organonitrate explosive standards was performed by gas chromatography (GC) with dual electron capture detection (ECD2) and electron-impact ionization quadrupole mass spectrometry (EI-MS) in selected ion monitoring (SIM) detec
Autor:
Jonathan M. Oyler, D. E. Hardy, Roderick R. Kunz, Stanley A. Ostazeski, Kerin Clow Gregory, Augustus W. Fountain
Publikováno v:
Analytical and Bioanalytical Chemistry. 395:357-369
A campaign to measure the amount of trace explosive residues in an operational military environment was conducted on May 27-31, 2007, at the National Training Center at Fort Irwin, CA, USA. The objectives of this campaign were to develop the methods
Autor:
Roderick R. Kunz, D. K. Downs, Theodore M. Bloomstein, D. E. Hardy, Jane E. Curtin, Russell B. Goodman
Publikováno v:
Journal of Photopolymer Science and Technology. 12:561-570
We have measured the transparencies of a number of candidate resist materials for 157nm, with an emphasis on determining which chemical platforms would allow resists to be used at maximum thicknesses while meeting requirements for optical density. As
Publikováno v:
Journal of chromatographic science. 48(4)
Gas chromatography with electron capture detection (GC-ECD) analysis of explosive-related nitro organic compounds was performed using four different column stationary phases with the focus being on their impact on analyte stability and transfer effic
Publikováno v:
Optics express. 13(2)
A variable -transmittance apodizing filter has been designed and demonstrated at 157 nm. The Gaussian transmission function is created by flowing oxygen gas, which is absorptive below 185 nm, between the two spherical surfaces of meniscus lenses. By
Autor:
D. E. Hardy, Vladimir Liberman, Andrew Grenville, Michael Switkes, Jan H. C. Sedlacek, Stephen T. Palmacci, Mordechai Rothschild
Publikováno v:
Optical Microlithography XVIII.
The final projection lens element in a 193-nm immersion-based lithographic tool will be in direct contact with water during irradiation. Thus, any lifetime considerations for the lens must include durability data of lens materials and thin films in a
Publikováno v:
Optical Microlithography XVIII.
In liquid immersion lithography the last optical element is in intimate contact with the liquid for extended periods of time, and therefore is at risk of being contaminated by impurities in the liquid. The purity of the liquid must be kept under stri
Autor:
Leonardus H. A. Leunissen, D. E. Hardy, Marylyn Hoy Bennett, Andrew Grenville, Theodore M. Bloomstein, Scott D. Hector, Mordechai Rothschild, James N. Hilfiker, Shane R. Palmer, Vicky Philipsen
Publikováno v:
Optical Microlithography XVIII.
Polarization dependent diffraction efficiencies in transmission through gratings on specially designed masks with pitch comparable to the wavelength were measured using an angle-resolved scatterometry apparatus with a 193 nm excimer source. Four mask
Autor:
Susan G. Cann, Christopher J. Vineis, J.W. Chludzinski, Mordechai Rothschild, N. N. Efremow, J.C. Twichell, Reuel B. Swint, D. E. Hardy, Douglas C. Oakley, George W. Turner, M. F. Marchant, Paul W. Juodawlkis, A. Napoleone, Theodore M. Bloomstein
Publikováno v:
2005 IEEE LEOS Annual Meeting Conference Proceedings.
InP/InGaAs/InP heterostructures were selectively grown in an array of 60 nm holes on a 90 nm pitch by MOCVD. The pattern was defined photolithographically directly in hydrogen silsesquioxane, a spin-on-glass, obviating the need for pattern transfer p
Publikováno v:
SPIE Proceedings.
An angle-resolved scattering detection system has been designed and implemented for use at 157 nm. This tool will enable the optimization of polishing and thin-film deposition, whith an eye towards minimizing small-angle scatter in projection lithogr