Zobrazeno 1 - 4
of 4
pro vyhledávání: '"D. B. Saint John"'
Publikováno v:
Thin Solid Films. 571:548-553
Ellipsometric spectra have been analyzed using a procedure whereby the complex dielectric function (e = e1 + ie2) is parameterized using different, physically realistic models in isolated regions of a single spectrum while layer thicknesses are kept
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef6f2b781b76f9f2e51aa789cc46c5e0
https://doi.org/10.1016/j.tsf.2014.03.020
https://doi.org/10.1016/j.tsf.2014.03.020
Autor:
Elizabeth C. Dickey, Nikolas J. Podraza, Susan Trolier-McKinstry, Heidi M. Schulze, Song Won Ko, D. B. Saint John, Jia Li
Publikováno v:
Thin Solid Films. 519:2919-2923
Nickel manganite thin films of interest for microbolometer applications have been prepared using chemical solution and spin spray deposition and studied using transmission electron microscopy to quantify the material crystallinity and spectroscopic e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75ad0b781af145e3d4640314e12d7e95
https://doi.org/10.1016/j.tsf.2010.11.088
https://doi.org/10.1016/j.tsf.2010.11.088
Autor:
Nikolas J. Podraza, Elizabeth C. Dickey, D. B. Saint John, Hang Beum Shin, Myung Yoon Lee, Thomas N. Jackson
Publikováno v:
SPIE Proceedings.
Hydrogenated silicon (Si:H) and germanium (Ge:H) are assessed for use as the resistive sensing layer in uncooled infrared microbolometer applications. N-type doped Si:H and undoped Ge:H thin films have been deposited using plasma enhanced chemical va
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c50bf767e33cb174184464ce00ab6d21
https://doi.org/10.1117/12.884269
https://doi.org/10.1117/12.884269
Publikováno v:
Microscopy and Microanalysis. 14:406-407
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8d283035e22a0c9ae8fac80f02af628
https://doi.org/10.1017/s1431927608087631
https://doi.org/10.1017/s1431927608087631