Zobrazeno 1 - 10
of 19
pro vyhledávání: '"D. A. Jesson"'
Publikováno v:
AIP Advances, Vol 2, Iss 2, Pp 022152-022152-6 (2012)
A maskless method of electron beam lithography is described which uses the reflection of an electron beam from an electrostatic mirror to produce caustics in the demagnified image projected onto a resist–coated wafer. By varying the electron optics
Externí odkaz:
https://doaj.org/article/174bc4ce87d1409a804c5a6431485d23
Publikováno v:
Ultramicroscopy. 200
We propose a general strategy for surface phase discrimination by dark-field imaging using low energy electrons, which maximizes contrast using diffraction spots, at selected optimal energies. The method can be automated to produce composite phase ma
Publikováno v:
Surface Review and Letters. 16(06):855-867
A wave optical treatment of surface step contrast in a low-energy electron microscopy (LEEM) is presented. The aberrations of an idealised LEEM imaging system are directly incorporated into a transfer function (TF) and image simulations of surface st
Cements, which are intrinsically brittle materials, can exhibit a degree of pseudo-ductility when reinforced with a sufficient volume fraction of a fibrous phase. This class of materials, called Engineered Cement Composites (ECC) has the potential to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::59e255c2192ef1e3858139073cd15068
Autor:
S. J. Pennycook, D. E. Jesson
Publikováno v:
Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences. 449:273-293
Thermal diffuse scattering of electrons through large angles by a simple low-index crystal projection is examined in the context of a phonon model, based on the Warren approximation of X-ray diffraction. The scattering from an individual atomic colum
Autor:
D. E. Jesson, S. J. Pennycook
Publikováno v:
Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences. 441:261-281
We consider the imaging of phase objects using a scanning transmission electron microscope equipped with a large inner-angle annular detector. We show, contrary to popular expectation, that incoherent imaging theory can be used to describe the imagin
Autor:
John W Steeds, D. E. Jesson
Publikováno v:
Philosophical Magazine A. 61:363-384
Three-dimensional diffraction from the [0001] axis of 2Hb-MoS2 is examined as a special case of diffraction from zone axes which consist of projected atomic strings containing more than one atom species. In particular, a complicating effect due to mo
Autor:
D. E. Jesson, John W Steeds
Publikováno v:
Philosophical Magazine A. 61:385-415
An accessible theory of higher-order Laue zone (HOLZ) diffraction from crystals containing transverse stacking faults is presented. This is used to investigate the sensitivity of intensity profiles to displacement vector, fault depth and absorption e
Autor:
D. H. Lowndes, A. P. Alivisatos, M. Alper, R. S. Averback, J. Jacob Barhen, J. A. Eastman, D. Imre, I. McNulty, T. A. Michalske, K-M Ho, A. J. Nozik, T. P. Russell, R. A. Valentin, D. O. Welch, J. Barhen, S. R. Agnew, P. Bellon, J. Blair, L. A. Boatner, Y. Braiman, J. D. Budai, G. W. Crabtree, L. C. Feldman, C. P. Flynn, D. B. Geohegan, E. P. George, E. Greenbaum, C. Grigoropoulos, T. E. Haynes, J. Heberlein, J. Hichman, O. W. Holland, S. Honda, J. A. Horton, M. Z.-C. Hu, D. E. Jesson, D. C. Joy, A. Krauss, W.-K. Kwok, B. C. Larson, D. J. Larson, K. Likharev, C. T. Liu, A. Majumdar, P. J. Maziasz, A. Meldrum, J. C. Miller, F. A. Modine, S. J. Pennycook, G. M. Pharr, S. Phillpot, D. L. Price, V. Protopopescu, D. B. Poker, D. Pui, J. M. Ramsey, N. Rao, L. Reichl, J. Roberto, M-L Saboungi, M. Simpson, S. Strieffer, T. Thundat, M. Wambsganss, J. Wendleken, C. W. White, G. Wilemski, S. P. Withrow, D. Wolf, J. H. Zhu, R. A. Zuhr, A. Zunger, S. Lowe
This report describes important future research directions in nanoscale science, engineering and technology. It was prepared in connection with an anticipated national research initiative on nanotechnology for the twenty-first century. The research d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::daf9e67a0a727ea6cbd8994259429221
https://doi.org/10.2172/899254
https://doi.org/10.2172/899254
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 53:78-79
The study of materials by electron microscopy has traditionally been divided into two sub-fields, imaging and microanalysis. While both of these have advanced to the level of atomic sensitivity, a complete characterization of a materials structure, c