Zobrazeno 1 - 2
of 2
pro vyhledávání: '"D. A. Goloschapov"'
Autor:
Pavel Seredin, D. A. Goloschapov, A. S. Lenshin, V. E. Ternovaya, I. S. Tarasov, I. N. Arsentyev, A. D. Bondarev
Publikováno v:
Bulletin of the Russian Academy of Sciences: Physics. 81:1119-1126
IR and UV spectroscopy is used to study the properties of nanostructured aluminum nitride films obtained via reactive ion-plasma sputtering on GaAs substrates with different orientations. Nanostructured thin (100–200 nm) films of cubic aluminum nit
Autor:
Pavel Seredin, L. S. Vavilova, I. N. Arsent’ev, A. S. Lenshin, I. S. Tarasov, D. L. Goloschapov, A. D. Bondarev, A. N. Lukin
Publikováno v:
Semiconductors. 48:1527-1531
Structural analysis and optical spectroscopy are used to study the properties of ultrathin Al2O3 films deposited in an ion-plasma sputtering installation. It is possible to demonstrate that the technological method used to deposit the films can yield