Zobrazeno 1 - 6
of 6
pro vyhledávání: '"D. A. Clymer"'
Autor:
Jean-Marie Lauenstein, Jeffrey L. Titus, K. Huntington, L. W. Mason, D. A. Clymer, M. Sivertz, R. Koga, E. Beach, T.L. Turflinger, Stephen E. Stone, J. George
Publikováno v:
IEEE Transactions on Nuclear Science. 64:317-324
Single-event effects (SEE) evaluation of five different part types of next generation, commercial trench MOSFETs indicates large part-to-part variation in determining a safe operating area (SOA) for drain-source voltage ( $\text {V}_{\mathrm { {DS}}}
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0fd37fc2f8d62515b1801943e097294c
https://doi.org/10.1109/tns.2016.2633358
https://doi.org/10.1109/tns.2016.2633358
Autor:
K. Huntington, E. Beach, D. A. Clymer, T.L. Turflinger, R. Koga, L. W. Mason, Stephen E. Stone, J. George
Publikováno v:
IEEE Transactions on Nuclear Science. 64:309-316
A study of proton-induced destructive SEE (DSEE) from Au-plated lid fission fragments has been expanded. Seventeen additional lid materials (Z =26–83) are studied. Lead (Pb) produced a higher sensitivity than seen in previous work with gold (Au), r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6042dff6c94d0ddef77e09dc62693bcf
https://doi.org/10.1109/tns.2016.2626960
https://doi.org/10.1109/tns.2016.2626960
Autor:
R. Koga, M.W. Savage, L. W. Mason, J. George, D. A. Clymer, E. Beach, Stephen E. Stone, T.L. Turflinger, K. Huntington
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2468-2475
Proton single event dielectric rupture was observed in Analog Devices OP470 devices only when the package included gold flashing facing the die on the inner surface of the metal lid. The supply voltage was also a factor. Analysis shows that proton on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c7213e65f11a6c6fa5c49e6d2ae75a30
https://doi.org/10.1109/tns.2015.2496288
https://doi.org/10.1109/tns.2015.2496288
Autor:
Ani Khachatrian, S. P. Buchner, D. A. Clymer, Dale McMorrow, J. H. Warner, Nicolas J.-H. Roche
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
The propagation of Analog Single Event Transients (ASETs) to multiple outputs of Bipolar Junction Transistor (BJTs) Integrated Circuits (ICs) is reported for the first time. The results demonstrate that ASETs can appear at several outputs of a BJT am
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f344b461ab7852b757ab73bba819f117
https://doi.org/10.1109/radecs.2015.7365630
https://doi.org/10.1109/radecs.2015.7365630
Publikováno v:
The Journal of the American Osteopathic Association. 74(9)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::2fb85abaa3ef4f2148761e0eaca6cf66
https://pubmed.ncbi.nlm.nih.gov/1039017
https://pubmed.ncbi.nlm.nih.gov/1039017
Publikováno v:
The Journal of the American Osteopathic Association. 72(2)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::2ede5be9ef3fd72170c341f208ea6833
https://pubmed.ncbi.nlm.nih.gov/4484638
https://pubmed.ncbi.nlm.nih.gov/4484638