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pro vyhledávání: '"D. A. Boychenko"'
Publikováno v:
JP Journal of Heat and Mass Transfer. 30:61-74
Publikováno v:
Безопасность информационных технологий, Vol 24, Iss 1, Pp 73-84 (2017)
The paper presents SEE rate calculation using different models. It is shown the most conservative estimate for rate prediction is thin layer model. A new approach to set IC’s SEE requirements is suggested. It is based on operational reliability fai
Externí odkaz:
https://doaj.org/article/9bfe661c008a476c882815688d5afba7
Publikováno v:
RAD Conference Proceedings.