Zobrazeno 1 - 10
of 164
pro vyhledávání: '"D Shawn"'
Publikováno v:
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST).
Autor:
Ruben Purdy, R. D. Shawn Blanton
Publikováno v:
2022 23rd International Symposium on Quality Electronic Design (ISQED).
Publikováno v:
VTS
Logic diagnosis is a software-based methodology to identify the behavior and location of defects in failing integrated circuits, which is an essential step in yield learning. Conventionally, accurate diagnosis requires a sufficient amount of failing
Autor:
R. D. Shawn Blanton, Zeye Liu
Publikováno v:
ITC
Test vehicles of various types that aim to identify yield detractors are essential for maturing a new semiconductor process before high volume production. Due to large number of unpredictable geometries created by place-and-route, test vehicles that
Publikováno v:
ITC
Logic diagnosis aims to identify defects in falling integrated circuits (ICs) and thus plays an essential role in yield learning. Previous research has demonstrated that diagnosis outcome (defect number, resolution, etc.) can be accurately predicted
Publikováno v:
ITC
IC diagnosis, as a key-step of yield learning, helps to uncover the root cause of chip failure. High quality diagnosis results, measured in terms of accuracy and resolution, are crucial for physical failure analysis during fast yield ramping. Despite
Autor:
St Shawn D Peter, D Shawn
Publikováno v:
Pearls and Tricks in Pediatric Surgery ISBN: 9783030510664
Although there are a large variety of acquired conditions affecting the lung and pleura, the most common disease process that requires surgical engagement is the spectrum of parapneumonic effusions. This chapter focuses on this spectrum with focus on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::906f15a61914de77801483741b1eb337
https://doi.org/10.1007/978-3-030-51067-1_10
https://doi.org/10.1007/978-3-030-51067-1_10
Publikováno v:
ITC-Asia
Logic diagnosis is a software-based methodology to identify the behavior and location of defects in failing integrated circuits, which is an essential step in yield learning. However, accurate diagnosis requires a sufficient amount of failing data, w
Publikováno v:
ITC-Asia
Logic diagnosis aims to identify defects in falling integrated circuits (ICs) and thus plays an essential role in yield learning. Previous research has demonstrated that diagnosis outcome (defect number, resolution, etc.) can be accurately predicted