Zobrazeno 1 - 10
of 777
pro vyhledávání: '"D Shawn"'
Publikováno v:
Official Board Markets. 6/3/2006, Vol. 82 Issue 22, p6-6. 1/9p.
Publikováno v:
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe72da80fe7bbce0199af72001a0f864
https://doi.org/10.1109/host54066.2022.9840239
https://doi.org/10.1109/host54066.2022.9840239
Autor:
Ruben Purdy, R. D. Shawn Blanton
Publikováno v:
2022 23rd International Symposium on Quality Electronic Design (ISQED).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86304d37f227f235c1c89f798684273f
https://doi.org/10.1109/isqed54688.2022.9806265
https://doi.org/10.1109/isqed54688.2022.9806265
Publikováno v:
Media Industry Newsletter. 1/14/2008, Vol. 61 Issue 2, p7-7. 1/6p.
Publikováno v:
VTS
Logic diagnosis is a software-based methodology to identify the behavior and location of defects in failing integrated circuits, which is an essential step in yield learning. Conventionally, accurate diagnosis requires a sufficient amount of failing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::913d762cfb28bf293511ff8c018dc5b4
https://doi.org/10.1109/vts50974.2021.9441003
https://doi.org/10.1109/vts50974.2021.9441003
Autor:
Jianqi Chen, Zaman, Monir, Makris, Yiorgos, Blanton, R. D. (Shawn), Mitra, Subhasish, Schafer, Benjamin Carrion
Publikováno v:
DAC: Annual ACM/IEEE Design Automation Conference; 2020, Issue 57, p31-36, 6p
Autor:
R. D. Shawn Blanton, Zeye Liu
Publikováno v:
ITC
Test vehicles of various types that aim to identify yield detractors are essential for maturing a new semiconductor process before high volume production. Due to large number of unpredictable geometries created by place-and-route, test vehicles that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03c2fd5f7daddfe2467713fc3088bd7a
https://doi.org/10.1109/itc44778.2020.9325244
https://doi.org/10.1109/itc44778.2020.9325244
Publikováno v:
ITC
Logic diagnosis aims to identify defects in falling integrated circuits (ICs) and thus plays an essential role in yield learning. Previous research has demonstrated that diagnosis outcome (defect number, resolution, etc.) can be accurately predicted
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24604c748b4f69ce0be96374896c6b1e
https://doi.org/10.1109/itc44778.2020.9325214
https://doi.org/10.1109/itc44778.2020.9325214
Publikováno v:
ITC
IC diagnosis, as a key-step of yield learning, helps to uncover the root cause of chip failure. High quality diagnosis results, measured in terms of accuracy and resolution, are crucial for physical failure analysis during fast yield ramping. Despite
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e91c9951fb20a69e30b8e2b1c407921
https://doi.org/10.1109/itc44778.2020.9325212
https://doi.org/10.1109/itc44778.2020.9325212