Zobrazeno 1 - 10
of 40
pro vyhledávání: '"D K, Nichols"'
Publikováno v:
Veterinary Pathology. 47:852-870
Smallpox was one of the most devastating diseases known to humanity. Although smallpox was eradicated through a historically successful vaccination campaign, there is concern in the global community that either Variola virus (VARV), the causative age
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ec008a6ff18b1e7262ca25f15f64573
https://doi.org/10.1177/0300985810378649
https://doi.org/10.1177/0300985810378649
Publikováno v:
IEEE Transactions on Nuclear Science. 44:2315-2324
Single-event upset was investigated in high-density flash memories from two different manufacturers. Many types of functional abnormalities can be introduced in these devices by heavy-ions because of their complex internal architecture. Changes in th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d4855e43f38a8e6c452d6e1d2c5c0ab3
https://doi.org/10.1109/23.659053
https://doi.org/10.1109/23.659053
Publikováno v:
IEEE Transactions on Nuclear Science. 43:2960-2967
This paper presents a display of heavy-ion- and proton-induced single event transients for three comparators. The transient vital signs are serious: low LET threshold, very high voltage amplitude and extended pulse duration (microsecs.).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ffdb1489edc6f3083d0080a20ed1b845
https://doi.org/10.1109/23.556892
https://doi.org/10.1109/23.556892
Autor:
W.R. Crain, D. K. Nichols, K. Watson, S.J. Hansel, H.R. Schwartz, G. A. Soli, R. Koga, L. S. Smith, K.B. Crawford, D. D. Lau
Publikováno v:
IEEE Transactions on Nuclear Science. 38:1529-1539
Jet Propulsion Laboratory (JPL) and the Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data (previous sets were reported in contribution IEEE Trans. on Nuclear Sci. in December 1985, 1987, and 1989). Tr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed7f9d2aaca67fc4f56a72eb0c3e8b83
https://doi.org/10.1109/23.124142
https://doi.org/10.1109/23.124142
Autor:
R. Koga, J.R. Coss, S.J. Hansel, K.B. Crawford, D. K. Nichols, G.M. Swift, L. S. Smith, H.R. Schwartz, K.P. McCarty, W.R. Crain, R.K. Watson
Publikováno v:
1993 IEEE Radiation Effects Data Workshop.
A fifth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications (1,2,3,4) in December issues for 1985, 1987, 1989, and 1991. Trends in SEE susceptibility (including soft errors and latchup) for state
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https://explore.openaire.eu/search/publication?articleId=doi_________::15db2322f20eb371b99e4f48cb7b84c0
https://doi.org/10.1109/redw.1993.700561
https://doi.org/10.1109/redw.1993.700561
Publikováno v:
Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95).
The sixth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications in December issues of IEEE - Nuclear Science Transactions for 1985, 1987, 1989, 1991, and the IEEE Workshop Record, 1993. Trends in S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::167653dc00d389f0a15388776a1bda43
https://doi.org/10.1109/redw.1995.483258
https://doi.org/10.1109/redw.1995.483258
Autor:
J.R. Coss, J.L. Wert, J. Groninger, P.P. Majewski, D.L. Oberg, D. K. Nichols, A. E. Waskiewicz, K.P. McCarty, R. Koga
Publikováno v:
Workshop Record. 1994 IEEE Radiation Effects Data Workshop.
This first compendium of single event test data for power MOSFETs provides failure thresholds from burnout or gate rupture for over 100 devices of eight manufacturers. Ordering the data has also provided some useful insights.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0236e66f14a5b64fba5473a42060a5fe
https://doi.org/10.1109/redw.1994.633035
https://doi.org/10.1109/redw.1994.633035
Publikováno v:
RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3).
Several types of power MOSFETs were irradiated with heavy ions to characterize either single event gate rupture (SEGR) or single event burnout (SEB). The implications of the data, showing temperature-dependence and beam angle-dependence for SEGR, are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48d3d4ada77cf6f31ecaeb79b30bde81
https://doi.org/10.1109/radecs.1993.316559
https://doi.org/10.1109/radecs.1993.316559
Publikováno v:
IEEE Transactions on Nuclear Science. 39:1654-1656
Proton-induced latchup in a CMOS microprocessor known to have a very low heavy-ion-induced latchup threshold LET was observed. The latchup cross section vs. proton energy for three different bias conditions is displayed. Average measured of latchup c
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https://explore.openaire.eu/search/publication?articleId=doi_________::b7a0b78d37499c6369367a6012889b18
https://doi.org/10.1109/23.211349
https://doi.org/10.1109/23.211349
Publikováno v:
Journal of zoo and wildlife medicine : official publication of the American Association of Zoo Veterinarians. 30(4)
Reference hematologic and plasma chemistry values were determined from 103 blood samples collected from 53 clinically healthy brown tree snakes (Boiga irregularis). Female snakes had significantly higher mean plasma values for total solids, total pro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::3f343b24a7f6e7ecf95b748bf720695f
https://pubmed.ncbi.nlm.nih.gov/10749437
https://pubmed.ncbi.nlm.nih.gov/10749437