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Akademický článek

Electrostatic subframing and compressive-sensing video in transmission electron microscopy

Autor: B. W. Reed, A. A. Moghadam, R. S. Bloom, S. T. Park, A. M. Monterrosa, P. M. Price, C. M. Barr, S. A. Briggs, K. Hattar, J. T. McKeown, D. J. Masiel

Publikováno v: Structural Dynamics, Vol 6, Iss 5, Pp 054303-054303-14 (2019)

We present kilohertz-scale video capture rates in a transmission electron microscope, using a camera normally limited to hertz-scale acquisition. An electrostatic deflector rasters a discrete array of images over a large camera, decoupling the acquis

Externí odkaz: https://doaj.org/article/3cfb1b8b33cb479889bd2fa4003676da

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Electrostatic Switching for Spatiotemporal Dose Control in a Transmission Electron Microscope

Autor: B W Reed, R S Bloom, G Eyzaguirre, C Henrichs, A A Moghadam, D J Masiel

Publikováno v: Microscopy and Microanalysis. 28:2230-2231

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1f313977d3c8ffddb654407ec3ddfe6a
https://doi.org/10.1017/s1431927622008595

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Fundamental Mechanisms Driving the Amorphous to Crystalline Phase Transformation

Autor: S. Meister, N D Browning, Teya Topuria, Simone Raoux, Yi Cui, Geoffrey H. Campbell, Thomas LaGrange, G H Gilmer, B.W. Reed, M K Santala, D J Masiel

Phase transformations are ubiquitous, fundamental phenomena that lie at the heart of many structural, optical and electronic properties in condensed matter physics and materials science. Many transformations, especially those occurring under extreme

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::151d9613a35e8f59ad7c3ca310dcd334
https://doi.org/10.2172/1018817

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Akademický článek

Advanced Compressive Sensing and Dynamic Sampling for 4D-STEM Imaging of Interfaces.

Autor: Smith J; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Tran H; Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Roccapriore KM; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Shen Z; Department of Mathematics, Georgia Institute of Technology, Atlanta, GA, 30332, USA., Zhang G; Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Chi M; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.; Thomas Lord Department of Mechanical Engineering & Materials Science, Duke University, Durham, NC, 27708, USA.

Publikováno v: Small methods [Small Methods] 2024 Sep 26, pp. e2400742. Date of Electronic Publication: 2024 Sep 26.

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