Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Dániel Olasz"'
Publikováno v:
Nanomaterials, Vol 14, Iss 11, p 925 (2024)
High-throughput methods are extremely important in today’s materials science, especially in the case of thin film characterization. The micro-combinatorial method enables the deposition and characterization of entire multicomponent thin film system
Externí odkaz:
https://doaj.org/article/0d1cedcaeeea48b0bf04e54893ea812e
Autor:
Cristina Silva, Khirdakhanim Salmanzade, Irina Borbáth, Erzsébet Dódony, Dániel Olasz, György Sáfrán, Andrei Kuncser, Erzsébet Pászti-Gere, András Tompos, Zoltán Pászti
Publikováno v:
Nanomaterials, Vol 13, Iss 15, p 2245 (2023)
The composites of transition metal-doped titania and carbon have emerged as promising supports for Pt electrocatalysts in PEM fuel cells. In these multifunctional supports, the oxide component stabilizes the Pt particles, while the dopant provides a
Externí odkaz:
https://doaj.org/article/21042f2567224575a527dda48847eb03
Publikováno v:
Micromachines, Vol 11, Iss 11, p 1023 (2020)
The depth-sensing indentation method has been applied for almost 30 years. In this review, a survey of several extended applications developed during the last three decades is provided. In depth-sensing indentation measurements, the load and penetrat
Externí odkaz:
https://doaj.org/article/46f7e96ad2524ab196857836b1ffe2f4
Autor:
Nguyen Q. Chinh, Dániel Olasz, Anwar Q. Ahmed, György Sáfrán, János Lendvai, Terence G. Langdon
Publikováno v:
Materials Science and Engineering: A. 862:144419
Experimental data show that the conventional Hall-Petch relationship cannot be maintained in its original form for metals having submicrometer structures. We now propose a dislocation model which modifies the Hall-Patch relationship to provide a unif
Autor:
Nikolett Hegedüs, Csaba Balázsi, Tamás Kolonits, Dániel Olasz, György Sáfrán, Miklós Serényi, Katalin Balázsi
Publikováno v:
Materials; Volume 15; Issue 18; Pages: 6313
In a single process run, an amorphous silicon oxynitride layer was grown, which includes the entire transition from oxide to nitride. The variation of the optical properties and the thickness of the layer was characterized by Spectroscopic Ellipsomet
Publikováno v:
Micromachines, Vol 11, Iss 1023, p 1023 (2020)
Micromachines
Micromachines
The depth-sensing indentation method has been applied for almost 30 years. In this review, a survey of several extended applications developed during the last three decades is provided. In depth-sensing indentation measurements, the load and penetrat