Zobrazeno 1 - 10
of 30
pro vyhledávání: '"D, Samberg"'
Publikováno v:
Scientific Reports, Vol 8, Iss 1, Pp 1-16 (2018)
Scientific Reports
Scientific Reports
Cognitive regulation of emotion develops from childhood into adulthood. This occurs in parallel with maturation of prefrontal cortical (PFC) regulation over the amygdala. The cellular substrates for this regulation may include PFC activation of inhib
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a7d767e539330eceffb6934f4efd846b
http://link.springer.com/article/10.1038/s41598-018-35649-0
http://link.springer.com/article/10.1038/s41598-018-35649-0
Autor:
Frank Seiboth, A. Jahn, Robert Hoppe, Christian Wenzel, Ulrike Boesenberg, Stephan Ritter, Christian G. Schroer, Gerald Falkenberg, Maria Scholz, Karola Richter, Jens Patommel, D. Samberg, Susanne Klare, Johann W. Bartha, Felix Wittwer
Publikováno v:
Applied physics letters 110(10), 101103 (2017). doi:10.1063/1.4977882
Applied physics letters 110(10), 101103 (2017). doi:10.1063/1.4977882
In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection [Bergemann et al., Phys. Rev. Lett
In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection [Bergemann et al., Phys. Rev. Lett
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1557074c8b7d60a36412dd4fd02dc3ee
https://bib-pubdb1.desy.de/record/318671
https://bib-pubdb1.desy.de/record/318671
Akademický článek
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Autor:
Shaughnessy B. Brown, Alan Fry, Eric Galtier, Brice Arnold, Frank Seiboth, Franz Tavella, Bob Nagler, Zhou Xing, Akel Hashim, Hae Ja Lee, Christian G. Schroer, D. Samberg, Arianna Gleason, Eduardo Granados, Andreas Schropp, Jerome B. Hastings
Publikováno v:
Review of scientific instruments 87(10), 103701 (2016). doi:10.1063/1.4963906
Review of scientific instruments 87(10), 103701 (2016). doi:10.1063/1.4963906
We describe the phase-contrast imaging instrument at the Matter in Extreme Conditions (MEC) endstation of the Linac Coherent Light Source. The instrument can image phe
We describe the phase-contrast imaging instrument at the Matter in Extreme Conditions (MEC) endstation of the Linac Coherent Light Source. The instrument can image phe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d3aab5d88b7aff2f67ba0e82c374479
http://arxiv.org/abs/1610.08583
http://arxiv.org/abs/1610.08583
Autor:
Martin Seyrich, Susanne Klare, Maik Kahnt, Stephan Ritter, Robert Hoppe, Christian G. Schroer, D. Samberg, Ralph Döhrmann, Maria Scholz, Frank Seiboth, Gerald Falkenberg, Juliane Reinhardt, Jens Patommel, C. Baumbach, A. Schropp, Felix Wittwer
Publikováno v:
AIP conference proceedings 1741, 030007 (2016). doi:10.1063/1.4952830
Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI2015, New York, USA, 2015-07-06-2015-07-10
Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI2015, New York, USA, 2015-07-06-2015-07-10
The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a5c882e321a01670b86c891b370dcf9b
https://bib-pubdb1.desy.de/record/301641
https://bib-pubdb1.desy.de/record/301641
Autor:
D. Samberg, Jens Patommel, Sandra Stephan, Robert Hoppe, Susanne Hönig, Andreas Schropp, A. Goldschmidt, S. Schöder, Manfred Burghammer, P. Boye, C. Rakete, Christian G. Schroer
Publikováno v:
Journal of Microscopy. 241:9-12
Summary We used hard X-ray scanning microscopy with ptychographic coherent diffraction contrast to image a front-end processed passivated microchip fabricated in 80 nm technology. No sample preparation was needed to image buried interconnects and con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8b45b12cc9ebe4c82e4b2a880a2072c
https://doi.org/10.1111/j.1365-2818.2010.03453.x
https://doi.org/10.1111/j.1365-2818.2010.03453.x
Autor:
Jens Patommel, D. Samberg, Sandra Stephan, Andreas Schwab, P. Boye, Andreas Schropp, J. M. Feldkamp, Nadja Reimers, Christian G. Schroer, Gerd Wellenreuther, Gerald Falkenberg
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 616:93-97
We describe the hard X-ray scanning microscope planned for the new synchrotron radiation source PETRA III at DESY in Hamburg, Germany. It is based on nanofocusing refractive X-ray lenses and is designed for two-dimensional mapping and scanning tomogr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a366fb3b8261f8d67b460a279c7a09b3
https://doi.org/10.1016/j.nima.2009.10.094
https://doi.org/10.1016/j.nima.2009.10.094
Autor:
Jens Patommel, Frank Seiboth, Andreas Schropp, Sandra Stephan, S. Schöder, Susanne Hönig, D. Samberg, Christian G. Schroer, Manfred Burghammer, Melissa A. Denecke, Gerald Falkenberg, Andy Goldschmidt, Robert Hoppe, Gerd Wellenreuther
Publikováno v:
SPIE Proceedings.
Modern hard x-ray scanning microscopes generate x-ray beams with lateral sizes well below 100 nm. Characterizing these beams in terms of shape and size by conventional techniques is tedious, requires highly accurate test objects and stages, and yield
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab288994a7a1514660b1fbb33018ab40
https://doi.org/10.1117/12.893055
https://doi.org/10.1117/12.893055
Autor:
A, Schropp, P, Boye, A, Goldschmidt, S, Hönig, R, Hoppe, J, Patommel, C, Rakete, D, Samberg, S, Stephan, S, Schöder, M, Burghammer, C G, Schroer
Publikováno v:
Journal of microscopy. 241(1)
We used hard X-ray scanning microscopy with ptychographic coherent diffraction contrast to image a front-end processed passivated microchip fabricated in 80 nm technology. No sample preparation was needed to image buried interconnects and contact lay
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::a58287f5cec30913524d026a76c78841
https://pubmed.ncbi.nlm.nih.gov/21118244
https://pubmed.ncbi.nlm.nih.gov/21118244
Akademický článek
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