Zobrazeno 1 - 10
of 272
pro vyhledávání: '"D, Nesheva"'
Autor:
D. Nesheva, M. Grujić-Brojčin, M.J. Šćepanović, Z. Levi, V. Dzhurkov, T. Hristova-Vasileva, B. Vasić
Nanolayers of porous ZnSe with thickness of ∼50 nm were prepared by thermal vacuum evaporation, applying continuous and periodically interrupted deposition at different deposition rates. The surface morphology and film composition are studied by SE
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::308a1106625affc0ce790fc4986c25ba
Akademický článek
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Publikováno v:
Journal of Physics: Conference Series. 2436:012020
ZnSe films with thickness of 50, 70 and 100 nm were prepared on Corning 7059 glass substrates at room temperature by applying continuous or periodically interrupted physical vapour deposition at very low deposition rates (0.2 and 0.5 nm s−1). Part
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fc29613fe0c80ef03a406468cb585fb
https://doi.org/10.1088/1742-6596/2436/1/012020
https://doi.org/10.1088/1742-6596/2436/1/012020
Autor:
A. Arias, N. Nedev, M. Curiel, R. Nedev, D. Mateos, E. Manolov, D. Nesheva, B. Valdez, R. Herrera, A. Sanchez
Publikováno v:
Sensor Letters. 13:556-560
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fda81f6c656cdad76f7d8a891e45a5cc
https://doi.org/10.1166/sl.2015.3336
https://doi.org/10.1166/sl.2015.3336
Autor:
A. Arias, N. Nedev, D. Nesheva, M. Curiel, E. Manolov, D. Mateos, V. Dzurkov, B. Valdez, O. Contreras, R. Herrera, I. Bineva, J. M. Siqueiros
Publikováno v:
Sensor Letters. 13:561-564
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::847bfd7b73d59503a6809417de1bc5a4
https://doi.org/10.1166/sl.2015.3337
https://doi.org/10.1166/sl.2015.3337
Autor:
Mario Curiel-Alvarez, D. Nesheva, E. Manolov, V. Dzhurkov, N. Nedev, Benjamín Valdez-Salas, J. Paz-Delgadillo
Publikováno v:
Journal of Physics: Conference Series. 1186:012022
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31c26cc9665c028a73cfffa8982bbcb3
https://doi.org/10.1088/1742-6596/1186/1/012022
https://doi.org/10.1088/1742-6596/1186/1/012022
Publikováno v:
Thin Solid Films. 520:2085-2091
The infra-red (IR) transmission spectra of SiO x (x ≤ 2) layers containing crystalline or amorphous Si nanoparticles deposited on p-Si substrates is simulated in the range 300–1500 cm − 1 . To that purpose the average dielectric function of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9bf907f96d6f9090da61c916d9e1e5e
https://doi.org/10.1016/j.tsf.2011.08.009
https://doi.org/10.1016/j.tsf.2011.08.009
Publikováno v:
The Journal of Physical Chemistry C. 115:37-46
The transport properties of nonequilibrium (photoexcited) charge carriers in sonochemically synthesized three-dimensional (3D) assemblies of AgBiS2 quantum dots (QDs) deposited as thin films were studied. To characterize the photoconduction of quantu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::797b2e1fa895961dec3624af49a4eecc
https://doi.org/10.1021/jp106605t
https://doi.org/10.1021/jp106605t
Autor:
Ivan Petrov, Nicola Nedev, I. Bineva, M. Sardela, J. A. N. T. Soares, Richard T. Haasch, E. Manolov, Mario Curiel, B. Sankaran, Benjamin Valdez, D. Nesheva
Publikováno v:
Materials Science and Engineering: B. 174:132-136
X-ray diffraction and reflectivity, X-ray photoelectron spectroscopy and spectroscopic ellipsometry were applied to study the initial composition, thickness, lattice structure and refractive index of ‘fresh’ and annealed thin SiOx films (∼15 nm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::88feaf8ddb3745699248c7a36c814a24
https://doi.org/10.1016/j.mseb.2010.03.007
https://doi.org/10.1016/j.mseb.2010.03.007