Zobrazeno 1 - 10
of 17
pro vyhledávání: '"D'Affroux, A."'
Autor:
Api Warsono, Diana Stephany Fernandez Rodas, Jérôme Rêche, Anaïs De Lehelle D'Affroux, Sébastien Bérard-Bergery
Publikováno v:
Novel Patterning Technologies 2023.
Autor:
Jérôme Rêche, Api Warsono, Anaïs De Lehelle D'Affroux, Jonas Khan, Sebastian Haumann, Andrea Kneidinger
Publikováno v:
Novel Patterning Technologies 2023.
Autor:
Jérôme Rêche, Maxime Argoud, Anaïs De Lehelle D'Affroux, Haidar Al Dujaili, Jonas Khan, Sebastian Haumann, Peter Ledel, Martin Eibelhuber
Publikováno v:
Novel Patterning Technologies 2022.
Autor:
Habrioux, A., Surblé, S., Berger, P., Khodja, H., D’Affroux, A., Mailley, S., Gutel, T., Patoux, S.
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B 1 November 2012 290:13-18
Autor:
Liddle, J. Alexander, Ruiz, Ricardo, Reche, Jerome, Warsono, Api, De Lehelle D'Affroux, Anaïs, Khan, Jonas, Haumann, Sebastian, Kneidinger, Andrea
Publikováno v:
Proceedings of SPIE; May 2023, Vol. 12497 Issue: 1 p124970Q-124970Q-5, 1124736p
Autor:
Liddle, J. Alexander, Ruiz, Ricardo, Warsono, Api, Fernandez Rodas, Diana, Rêche, Jérôme, De Lehelle d'Affroux, Anaïs, Berard Bergery, Sébastien
Publikováno v:
Proceedings of SPIE; May 2023, Vol. 12497 Issue: 1 p124970A-124970A-7, 1124738p
Autor:
Maxime Argoud, Anaïs De Lehelle D'Affroux, Martin Eibelhuber, Khatia Benotmane, Sebastian Haumann, Jérôme Reche, Jonas Khan
Publikováno v:
Novel Patterning Technologies 2021.
The NanoImprint Lithography (NIL) technology by using a soft stamp is today ready for high volume manufacturing (HVM) with the global solution proposed by EVG1. This UV-based imprint, using a transparent stamp is now a standard technology and the mos
Publikováno v:
2017 IEEE 19th Electronics Packaging Technology Conference (EPTC).
Spin-on passivation polymers are now widely used in Wafer Level Packaging (WLP) to comply with new stress and reliability requirements of 3D-IC process integrations. In a first study a robust spin-on dielectric polymer characterization protocol — a
Autor:
Panning, Eric M., Rêche, Jérôme, Argoud, Maxime, De Lehelle D'Affroux, Anaïs, Benotmane, Khatia, Haumann, Sebastian, Khan, Jonas, Eibelhuber, Martin
Publikováno v:
Proceedings of SPIE; February 2021, Vol. 11610 Issue: 1 p116100C-116100C-7, 1044908p
Autor:
S. Mailley, Hicham Khodja, T. Gutel, Aurélien Habrioux, A. D’Affroux, Pascal Berger, Suzy Surblé, S. Patoux
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2012, 290, pp.13-18. ⟨10.1016/j.nimb.2012.08.014⟩
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2012, 290, pp.13-18. ⟨10.1016/j.nimb.2012.08.014⟩
This paper provides original characterization of battery electrodes by means of nuclear microanalysis. It presents a non-invasive method to investigate simultaneously the concentrations and the distributions of the different constituent elements of a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13ad876d38107be9ffe0b8e3b2d8cfe0
https://hal.archives-ouvertes.fr/hal-00904478
https://hal.archives-ouvertes.fr/hal-00904478