Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Cyril Roscian"'
Autor:
Edith Kussener, Cyril Roscian, Nicolas Borrel, Clement Champeix, Marc Lacruche, Jean-Baptiste Rigaud, Alexandre Sarafianos, Jean-Max Dutertre
Publikováno v:
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, France. ⟨10.1109/IOLTS.2015.7229820⟩
IOLTS
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, France. ⟨10.1109/IOLTS.2015.7229820⟩
IOLTS
International audience; —Laser fault injection into SRAM cells is a widely used technique to perform fault attacks. In previous works, Roscian and Sarafianos studied the relations between the layout of the cell, its different laser-sensitive areas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::10bb9ab4b2e2bb9fb966f649f4700972
https://hal-emse.ccsd.cnrs.fr/emse-01227286/document
https://hal-emse.ccsd.cnrs.fr/emse-01227286/document
Autor:
Assia Tria, Cyril Roscian, Alexandre Sarafianos, Mathieu Lisart, Valerie Serradeil, Jean-Max Dutertre, Olivier Gagliano
Publikováno v:
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on, Oct 2013, New York, United States. ⟨10.1109/DFT.2013.6653598⟩
DFTS
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on, Oct 2013, New York, United States. ⟨10.1109/DFT.2013.6653598⟩
DFTS
International audience; This paper presents the design of an SRAM cell with a robustness improvement against laser-induced fault injection. We report the fault sensitivity mapping of a first SRAM design. A careful analysis of its results combined wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e5d9d35961496953768a680ca902b182
https://hal-emse.ccsd.cnrs.fr/emse-01109141
https://hal-emse.ccsd.cnrs.fr/emse-01109141
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2013, 53 (9-11), pp.1300-1305. ⟨10.1016/j.microrel.2013.07.125⟩
Microelectronics Reliability, 2013, 53 (9-11), pp.1300-1305. ⟨10.1016/j.microrel.2013.07.125⟩
Microelectronics Reliability, Elsevier, 2013, 53 (9-11), pp.1300-1305. ⟨10.1016/j.microrel.2013.07.125⟩
Microelectronics Reliability, 2013, 53 (9-11), pp.1300-1305. ⟨10.1016/j.microrel.2013.07.125⟩
International audience; This abstract presents an electrical model of an SRAM cell exposed to a pulsed Photoelectrical Laser Stimulation (PLS), based on our past model of MOS transistor under laser illumination. The validity of our model is assessed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::14a97f33ac81604e81854ab588fd4dbe
https://hal-emse.ccsd.cnrs.fr/emse-01100724/file/HAL_MR_2013_Electrical_modeling_of_the_photoelectric_effect_induced_by_a_pulsed_laser_applied_to_an_SRAM_cell.pdf
https://hal-emse.ccsd.cnrs.fr/emse-01100724/file/HAL_MR_2013_Electrical_modeling_of_the_photoelectric_effect_induced_by_a_pulsed_laser_applied_to_an_SRAM_cell.pdf
Publikováno v:
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2013 Workshop on
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2013 Workshop on, Aug 2013, Santa-Barbara, United States. ⟨10.1109/FDTC.2013.17⟩
FDTC
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2013 Workshop on, Aug 2013, Santa-Barbara, United States. ⟨10.1109/FDTC.2013.17⟩
FDTC
International audience; The use of a laser to inject faults into SRAM memory cells is well known. However, the corresponding fault model is often unknown or misunderstood: the induced faults may be described as bit-flip or bit-set/reset faults. We ha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1a22488acf5ec768cec17b1eb4d39b0
https://hal-emse.ccsd.cnrs.fr/emse-01109133/document
https://hal-emse.ccsd.cnrs.fr/emse-01109133/document
Publikováno v:
HOST
Hardware-Oriented Security and Trust (HOST), 2013 IEEE International Symposium on
Hardware-Oriented Security and Trust (HOST), 2013 IEEE International Symposium on, Jun 2013, Austin, United States. ⟨10.1109/HST.2013.6581576⟩
Hardware-Oriented Security and Trust (HOST), 2013 IEEE International Symposium on
Hardware-Oriented Security and Trust (HOST), 2013 IEEE International Symposium on, Jun 2013, Austin, United States. ⟨10.1109/HST.2013.6581576⟩
International audience; Laser fault injection through the front side (and consequently the metal-fills) of an IC is often performed with medium or small laser beams for the purpose of injecting bytewise faults. We have investigated in this paper the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::30ae65d02a6a4d96fd076586fb402d96
https://doi.org/10.1109/hst.2013.6581576
https://doi.org/10.1109/hst.2013.6581576
