Zobrazeno 1 - 10
of 65
pro vyhledávání: '"Currie, M.T."'
Autor:
Bera, L.K., Mathew, Shajan, Balasubramanian, N., Braithwaite, G., Currie, M.T., Singaporewala, F., Yap, J., Hammond, R., Lochtefeld, A., Bulsara, M.T., Fitzgerald, E.A.
Publikováno v:
In Applied Surface Science 2004 224(1):278-282
Autor:
Langdo, T.A, Currie, M.T, Cheng, Z.-Y, Fiorenza, J.G, Erdtmann, M, Braithwaite, G, Leitz, C.W, Vineis, C.J, Carlin, J.A, Lochtefeld, A, Bulsara, M.T, Lauer, I, Antoniadis, D.A, Somerville, M
Publikováno v:
In Solid State Electronics 2004 48(8):1357-1367
Autor:
Tan, C.S., Choi, W.K., Bera, L.K., Pey, K.L., Antoniadis, D.A., Fitzgerald, E.A., Currie, M.T., Maiti, C.K.
Publikováno v:
In Solid State Electronics 2001 45(11):1945-1949
Autor:
Andre, C.L., Boeckl, J.J., Leitz, C.W., Currie, M.T., Langdo, T.A., Fitzgerald, E.A., Ringel, S.A.
Publikováno v:
Journal of Applied Physics; 10/15/2003, Vol. 94 Issue 8, p4980, 6p, 1 Black and White Photograph, 4 Graphs
Publikováno v:
In Materials Science & Engineering B 1999 67(1):53-61
Autor:
Fiorenza, J.G., Braithwaite, G., Leitz, C., Currie, M.T., Cheng, Z.Y., Yang, V.K., Langdo, T., Carlin, J., Somerville, M., Lochtefeld, A., Badawi, H., Bulsara, M.T.
Publikováno v:
Proceedings of the 2004 IEEE International Reliability Physics Symposium; 2004, p493-497, 5p
Autor:
Currie, M.T.
Publikováno v:
2004 International Conference on Integrated Circuit Design & Technology (IEEE Cat. No.04EX866); 2004, p261-268, 8p
Autor:
Andre, C.L., Khan, A., Gonzalez, M., Hudait, M.K., Fitzgerald, E.A., Carlin, J.A., Currie, M.T., Leitz, C.W., Langdo, T.A., Clark, E.B., Wilt, D.M., Ringel, S.A.
Publikováno v:
Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002; 2002, p1043-1046, 4p
Publikováno v:
Technical Digest IEEE International MEMS 99 Conference Twelfth IEEE International Conference on Micro Electro Mechanical Systems (Cat No99CH36291); 1999, p205-210, 6p
Autor:
Chen, C.L., Langdo, T.A., Chen, C.K., Fiorenza, J.G., Wyatt, P.W., Currie, M.T., Leitz, C.W., Braithwaite, G., Fritze, M., Lambert, R., Yost, D.-R., Cheng, Z., Lochtefeld, A., Keast, C.K.
Publikováno v:
2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573); 2004, p86-88, 3p