Zobrazeno 1 - 10
of 211
pro vyhledávání: '"Croes, Kristof"'
Autor:
Soulié, Jean-Philippe, Sankaran, Kiroubanand, Van Troeye, Benoit, Leśniewska, Alicja, Pedreira, Olalla Varela, Oprins, Herman, Delie, Gilles, Fleischmann, Claudia, Boakes, Lizzie, Rolin, Cédric, Ragnarsson, Lars-Åke, Croes, Kristof, Park, Seongho, Swerts, Johan, Pourtois, Geoffrey, Tőkei, Zsolt, Adelmann, Christoph
Today, interconnect resistance and reliability are key limiters for the performance of advanced CMOS circuits. As transistor scaling is slowing, interconnect scaling has become the main driver for circuit miniaturization, and interconnect limitations
Externí odkaz:
http://arxiv.org/abs/2406.09106
Autor:
Deng, Qingzhong, El-Saeed, Ahmed H., Elshazly, Alaa, Lepage, Guy, Marchese, Chiara, Kobbi, Hakim, Magdziak, Rafal, De Coster, Jeroen, Singh, Neha, Filipcic, Marko Ersek, Croes, Kristof, Velenis, Dimitrios, Chakrabarti, Maumita, De Heyn, Peter, Verheyen, Peter, Absil, Philippe, Ferraro, Filippo, Ban, Yoojin, Van Campenhout, Joris
To the best of our knowledge, this paper has achieved the lowest thermal tuning power (5.85 mW/pi) for silicon rings with FSR>=3.2 THz, and the first silicon ring-based WDM-32x100 GHz filter.
Comment: 3 pages submitted for conference
Comment: 3 pages submitted for conference
Externí odkaz:
http://arxiv.org/abs/2311.12036
Publikováno v:
In Solid State Electronics April 2024 214
Publikováno v:
In Solid State Electronics April 2024 214
Publikováno v:
In Solid State Electronics March 2024 213
Akademický článek
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Autor:
Chery, Emmanuel, Brady-Boyd, Anita, Lin, Yuyuan, Grimes, Michael, Springer, David, Slabbekoorn, John, Walsby, Edward, Croes, Kristof, Beyne, Eric
Publikováno v:
In Microelectronic Engineering 15 October 2022 266
Modelling stress evolution and voiding in advanced copper nano-interconnects under thermal gradients
Autor:
Zahedmanesh, Houman, Croes, Kristof
Publikováno v:
In Microelectronics Reliability August 2020 111
Effects of isothermal storage on grain structure of Cu/Sn/Cu microbump interconnects for 3D stacking
Autor:
Panchenko, Iuliana, Wolter, Klaus-Juergen, Croes, Kristof, De Wolf, Ingrid, De Messemaeker, Joke, Beyne, Eric, Wolf, M. Juergen
Publikováno v:
In Microelectronics Reliability November 2019 102
Publikováno v:
Proceedings of SPIE; March 2024, Vol. 12890 Issue: 1 p128900F-128900F-6, 1160107p